Measurement of Scattered Radiation Using Ionization Chamber-Based Survey Meter with Variable Phantom Thickness and Kilovoltage in a Digital Radiographic Room

Abstract Scattered radiation in diagnostic radiology is a source of radiation exposure to medical staff. It mostly originates from patient interaction during X-ray exposure. Its intensity is determined by technical conditions, including kilovoltage (kVp), phantom thickness, and field size. This research endeavors to quantify scatter radiation with an ionization chamber-based survey meter for different conditions of kVp and phantom thickness to assess its effect in a digital radiographic room. A GE Definium XR-8000 digital X-ray machine served as the source of radiation. Scattered radiation at a standard distance and angle was measured with the help of the Fluke 451P ionization chamber-based survey meter. Both a basic water phantom and a general radiographic polymethyl methacrylate phantom were employed with varying thicknesses (5–25 cm and 10–40 mm, respectively). Scattered radiation was measured across different tube voltages (50–125 kVp), while mAs and source-to-image distance were kept constant. Scattered radiation was proportional to both tube voltage and phantom thickness. In 25-cm water phantom thickness, scatter went from 0.38 mR at 50 kVp to 2.05 mR at 125 kVp. A rise in water phantom thickness from 5 to 25 cm at 80 kVp revealed a rise in scatter from 1.67 to 1.9 mR. The radiographic phantom exhibited a similar trend. Present values were higher as compared with values in literature, because the mAs setting was higher for this investigation. This study shows increased scatter with higher kVp and phantom thickness, emphasizing optimized parameters and ALARA (As Low As Reasonably Achievable) for radiation safety.