Mott variable-range hopping based calibration procedure for NTC thermistors in wide cryogenic temperature range

In this paper we propose a procedure based on the Mott variable-range hopping model that describes the low-temperature conduction in strongly disordered systems such as negative temperature coefficient (NTC) thermistors. This procedure offers a close approximation to the physical model and provides an accurate R ( T ) fit for the resistance − temperature data over three orders of magnitude temperature range (0.04 K — 40 K) using only 4 fit coefficients. Eventually, the temperature corresponding to any resistance value of the thermistor T ( R ) can be determined with an approximation of an inverted R ( T ) function based on a Puiseux series expansion. This approach has been showed to be applicable to different NTC thermistors, including ruthenium oxide (RuO 2 ) and germanium (Ge) resistors with a range of resistance values. It provides a root mean square of the relative residual of the fit Δ T rel RMS ≤ 1 % and Δ T rel RMS ≤ 1 . 7 % using a n fit ∈ [ 4 , 10 ] and n fit = 4 fit coefficients for RuO 2 and Ge, respectively. Previously reported procedures for the calibration of resistance-temperature data in low-temperature thermistors do not reach this accuracy with a similar number of fit coefficients. • We report on a comprehensive calibration procedure to fit resistance-temperature data set providing the R ( T ) function and its inversion T ( R ) • The R ( T ) function is derived from Mott variable-range hopping which describes the low temperature carrier transport in disordered semiconductors in an extended temperature range. The T ( R ) function is approximated using Puiseux series expansion. • This calibration procedure has been tested on different NTC thermistors over three orders of magnitude of temperature range (40 mK to 40 K). • This calibration procedure reports a root mean square of the relative residual of the fit Δ T rel RMS ≤ 1 % and Δ T rel RMS ≤ 1 . 7 % using a number of fit coefficients n fit ∈ [ 4 , 10 ] and n fit = 4 for RuO 2 and Ge, respectively. None of the common calibration equations can reach such a level of accuracy over the specified temperature range with the same number of fit coefficients. • Calibration precision doesn’t degrade but remains stable when more fit coefficients are added, as it happens, for instance, to the expansion series of the Basic Equation.

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Journal
Measurement
Published
2026-02-14
DOI
https://doi.org/10.1016/j.measurement.2026.120853
Primary Topic
Electrical and Thermal Properties of Materials
Type
article
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article

Mott variable-range hopping based calibration procedure for NTC thermistors in wide cryogenic temperature range

R. den Hartog, Paul van der Hulst, S. Visser
Measurement
Electrical and Thermal Properties of Materials
article

Mott variable-range hopping based calibration procedure for NTC thermistors in wide cryogenic temperature range

R. den Hartog, Paul van der Hulst, S. Visser
article en

Abstract

In this paper we propose a procedure based on the Mott variable-range hopping model that describes the low-temperature conduction in strongly disordered systems such as negative temperature coefficient (NTC) thermistors. This procedure offers a close approximation to the physical model and provides an accurate R ( T ) fit for the resistance − temperature data over three orders of magnitude temperature range (0.04 K — 40 K) using only 4 fit coefficients. Eventually, the temperature corresponding to any resistance value of the thermistor T ( R ) can be determined with an approximation of an inverted R ( T ) function based on a Puiseux series expansion. This approach has been showed to be applicable to different NTC thermistors, including ruthenium oxide (RuO 2 ) and germanium (Ge) resistors with a range of resistance values. It provides a root mean square of the relative residual of the fit Δ T rel RMS ≤ 1 % and Δ T rel RMS ≤ 1 . 7 % using a n fit ∈ [ 4 , 10 ] and n fit = 4 fit coefficients for RuO 2 and Ge, respectively. Previously reported procedures for the calibration of resistance-temperature data in low-temperature thermistors do not reach this accuracy with a similar number of fit coefficients. • We report on a comprehensive calibration procedure to fit resistance-temperature data set providing the R ( T ) function and its inversion T ( R ) • The R ( T ) function is derived from Mott variable-range hopping which describes the low temperature carrier transport in disordered semiconductors in an extended temperature range. The T ( R ) function is approximated using Puiseux series expansion. • This calibration procedure has been tested on different NTC thermistors over three orders of magnitude of temperature range (40 mK to 40 K). • This calibration procedure reports a root mean square of the relative residual of the fit Δ T rel RMS ≤ 1 % and Δ T rel RMS ≤ 1 . 7 % using a number of fit coefficients n fit ∈ [ 4 , 10 ] and n fit = 4 for RuO 2 and Ge, respectively. None of the common calibration equations can reach such a level of accuracy over the specified temperature range with the same number of fit coefficients. • Calibration precision doesn’t degrade but remains stable when more fit coefficients are added, as it happens, for instance, to the expansion series of the Basic Equation.

MeasurementVol. 270
Space Research Organisation Netherlands (NL)
Openalex Percentile: Top 55%
Electrical and Thermal Properties of Materials
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