Characterization of a Fault-Tolerant RISC-V SoC in an SRAM-based FPGA under Proton Irradiation

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SPIRE - Sciences Po Institutional REpository
Published
2026-03-17
Primary Topic
Radiation Effects in Electronics
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article
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article

Characterization of a Fault-Tolerant RISC-V SoC in an SRAM-based FPGA under Proton Irradiation

Wesley Grignani, F. Wrobel, Luigi Dilillo, Carolina Imianosky et al.
SPIRE - Sciences Po Institutional REpository
Radiation Effects in Electronics
article

Characterization of a Fault-Tolerant RISC-V SoC in an SRAM-based FPGA under Proton Irradiation

Wesley Grignani, F. Wrobel, Luigi Dilillo, Carolina Imianosky, Douglas A. Santos, Douglas R. Melo
article en

Abstract

No abstract available for this paper.
SPIRE - Sciences Po Institutional REpository
Institut d'Électronique et des Systèmes (FR), Universidade do Vale do Itajaí (BR)
Openalex Percentile: Top 56%
Radiation Effects in Electronics
Open Access PDFOpenAlex
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Characterization of a Fault-Tolerant RISC-V SoC in an SRAM-based FPGA under Proton Irradiation — Wesley Grignani, F. Wrobel, et al. · SPIRE - Sciences Po Institutional REpository (2026) | TGRS Research Map | TGRS