Container defect detection using enhanced YOLO with uncertainty-aware dynamic modulated convolution and parallelized patch-aware attention

Container defect detection is a critical task in industrial settings to ensure logistics safety and cargo integrity. However, conventional detection methods often fall short due to the diverse morphologies, varying scales of defects, and complex background interference. To address these challenges, we propose an enhanced single-stage object detection model, termed UPAD-YOLO. Specifically, we introduce a novel Uncertainty-Aware Dynamic Modulated Convolution (UDMConv), which dynamically adjusts the receptive field of convolutional kernels to efficiently extract multi-scale features, thereby accommodating the morphological diversity of defects while enhancing computational efficiency. We further integrate a Parallelized Patch-Aware Attention (PPA) module that leverages multi-branch architecture, patch-aware attention mechanisms, and both channel and spatial attention to substantially improve detection accuracy and robustness. In addition, the detection head of the original model is combined with an Adaptively Spatial Feature Fusion (ASFF) module to effectively integrate defect features across different resolution levels, thereby enhancing the model’s capability to recognize multi-scale defect patterns. Experimental results demonstrate that UPAD-YOLO outperforms the baseline model YOLOv11 in container defect detection, achieving a 4% improvement in mean Average Precision (mAP) and a 2.9% increase in F1-score, highlighting its robustness and practical applicability. This study not only offers an efficient and reliable solution for container defect detection but also provides valuable insights for broader applications in industrial visual inspection tasks.

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Publication Details

Journal
PeerJ Computer Science
Published
2026-02-13
DOI
https://doi.org/10.7717/peerj-cs.3627
Primary Topic
Advanced Neural Network Applications
Type
article
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Container defect detection using enhanced YOLO with uncertainty-aware dynamic modulated convolution and parallelized patch-aware attention

Zhiyong An, Dapeng Cheng, Benshuo Zhang, Feng Zhao et al.
PeerJ Computer Science
Advanced Neural Network Applications
article

Container defect detection using enhanced YOLO with uncertainty-aware dynamic modulated convolution and parallelized patch-aware attention

Zhiyong An, Dapeng Cheng, Benshuo Zhang, Feng Zhao, Xinhao Li, Zhipeng Liang
article en

Abstract

Container defect detection is a critical task in industrial settings to ensure logistics safety and cargo integrity. However, conventional detection methods often fall short due to the diverse morphologies, varying scales of defects, and complex background interference. To address these challenges, we propose an enhanced single-stage object detection model, termed UPAD-YOLO. Specifically, we introduce a novel Uncertainty-Aware Dynamic Modulated Convolution (UDMConv), which dynamically adjusts the receptive field of convolutional kernels to efficiently extract multi-scale features, thereby accommodating the morphological diversity of defects while enhancing computational efficiency. We further integrate a Parallelized Patch-Aware Attention (PPA) module that leverages multi-branch architecture, patch-aware attention mechanisms, and both channel and spatial attention to substantially improve detection accuracy and robustness. In addition, the detection head of the original model is combined with an Adaptively Spatial Feature Fusion (ASFF) module to effectively integrate defect features across different resolution levels, thereby enhancing the model’s capability to recognize multi-scale defect patterns. Experimental results demonstrate that UPAD-YOLO outperforms the baseline model YOLOv11 in container defect detection, achieving a 4% improvement in mean Average Precision (mAP) and a 2.9% increase in F1-score, highlighting its robustness and practical applicability. This study not only offers an efficient and reliable solution for container defect detection but also provides valuable insights for broader applications in industrial visual inspection tasks.

PeerJ Computer ScienceVol. 12
Beijing Normal-Hong Kong Baptist University (CN), Hong Kong Baptist University (HK), Yantai Academy of Agricultural Sciences (CN), Xinjiang Institute of Engineering (CN), Shandong Institute of Business and Technology (CN), Xinjiang University (CN)
Industry, innovation and infrastructure
Openalex Percentile: Top 57%
Advanced Neural Network Applications
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