Structural and chemical modifications of graphene oxide induced by high-energy electron beam irradiation

Electron beam irradiation has emerged as a powerful technique for modifying material properties at the atomic level, offering vast potential for advanced applications in nanotechnology and material science. This study investigates the impact of electron beam irradiation on graphene oxide (GO) thin films, focusing on structural, chemical, and electrical modifications. GO was synthesized using Hummer’s method. GO solution was drop-casted onto ITO substrate and dried. The GO thin film was then irradiated at varying doses (25 kGy to 200 kGy) using 3 MeV electron beam. Characterization was made using X-ray diffraction (XRD), Fourier transform infrared spectroscopy (FTIR), scanning electron microscopy with energy-dispersive X-ray (SEM EDX), x-ray photoelectron spectroscopy (XPS), and conductive atomic force microscopy (C-AFM). XRD analysis indicated notable changes in crystallinity, pointing to structural rearrangements induced by irradiation. At the 175 kGy dose, the irradiated graphene oxide achieved the best conductivity, and the C-AFM analysis showed a particle size of approximately 9.5 nm. The XPS and EDX analyses revealed a 0.81% reduction in oxygen concentration at an irradiation GO of 100 kGy compared to unirradiated dose. This reduction trend continues to be observable up to 175 kGy, indicating progressive deoxygenation. Among tested doses, 100 kGy appears to be the most optimal for achieving significant oxygen reduction, whereas higher doses, particularly at 175 kGy, are more favorable for enhancing the material’s conductivity. At 175 kGy, the material recorded an ideality factor of 8.92 is based on C-AFM measurements. FTIR spectra confirmed significant modifications in chemical bonding, providing evidence of functional group transformations. These findings collectively demonstrate that electron beam irradiation serves a versatile tool for tuning the physiochemical properties of GO thin films, enabling precise control over the structure and functionality. The irradiation-induced alteration of GO leads to a more conductive reduced graphene oxide (rGO) with lower oxygen content.

Authors

Institutions

Publication Details

Journal
Journal of Materials Science Materials in Electronics
Published
2026-02-01
DOI
https://doi.org/10.1007/s10854-026-16728-9
Primary Topic
Graphene research and applications
Type
article
Field-Weighted Citation Impact
0.00

Funders

Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

Structural and chemical modifications of graphene oxide induced by high-energy electron beam irradiation

İbrahim Şen, Norsakinah Johrin, Harzawardi Hasim, Saafie Salleh et al.
Journal of Materials Science Materials in Electronics
Graphene research and applications
article

Structural and chemical modifications of graphene oxide induced by high-energy electron beam irradiation

İbrahim Şen, Norsakinah Johrin, Harzawardi Hasim, Saafie Salleh, Pak Yan Moh, Fuei Pien Chee, Nur Syafiqa binti Md Nasir, Megat Muhammad Ikhsan bin Megat Hasnan, Jackson Hian Wui Chang, M. S. Al-Buriahi
article en

Abstract

Electron beam irradiation has emerged as a powerful technique for modifying material properties at the atomic level, offering vast potential for advanced applications in nanotechnology and material science. This study investigates the impact of electron beam irradiation on graphene oxide (GO) thin films, focusing on structural, chemical, and electrical modifications. GO was synthesized using Hummer’s method. GO solution was drop-casted onto ITO substrate and dried. The GO thin film was then irradiated at varying doses (25 kGy to 200 kGy) using 3 MeV electron beam. Characterization was made using X-ray diffraction (XRD), Fourier transform infrared spectroscopy (FTIR), scanning electron microscopy with energy-dispersive X-ray (SEM EDX), x-ray photoelectron spectroscopy (XPS), and conductive atomic force microscopy (C-AFM). XRD analysis indicated notable changes in crystallinity, pointing to structural rearrangements induced by irradiation. At the 175 kGy dose, the irradiated graphene oxide achieved the best conductivity, and the C-AFM analysis showed a particle size of approximately 9.5 nm. The XPS and EDX analyses revealed a 0.81% reduction in oxygen concentration at an irradiation GO of 100 kGy compared to unirradiated dose. This reduction trend continues to be observable up to 175 kGy, indicating progressive deoxygenation. Among tested doses, 100 kGy appears to be the most optimal for achieving significant oxygen reduction, whereas higher doses, particularly at 175 kGy, are more favorable for enhancing the material’s conductivity. At 175 kGy, the material recorded an ideality factor of 8.92 is based on C-AFM measurements. FTIR spectra confirmed significant modifications in chemical bonding, providing evidence of functional group transformations. These findings collectively demonstrate that electron beam irradiation serves a versatile tool for tuning the physiochemical properties of GO thin films, enabling precise control over the structure and functionality. The irradiation-induced alteration of GO leads to a more conductive reduced graphene oxide (rGO) with lower oxygen content.

Journal of Materials Science Materials in ElectronicsVol. 37(5)
Sakarya University (TR), Universiti of Malaysia Sabah (MY), Malaysian Nuclear Agency (MY), University of Malaya (MY)
Universiti Malaysia Sabah, Malaysia Toray Science Foundation, Toray Science Foundation
Openalex Percentile: Top 57%
Graphene research and applications
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.