High-resolution capacitance dilatometry of microscopically thin samples using a miniature dilatometer

We present a novel application of our high-resolution capacitance dilatometer, specifically engineered for the precise characterization of quantum materials. These materials, which often appear as ultrathin, platelet-shaped crystals, are known for exotic phenomena such as superconductivity, topological order, and quantum spin liquid. However, these crystals seldom reach macroscopic dimensions, making them unsuitable for conventional dilatometry techniques. By introducing a modified sample-mounting configuration, our design enables high-resolution measurements of thermal expansion and magnetostriction along in-plane crystallographic directions in samples with thicknesses well below 500 μm. Validation measurements using a Quantum Design PPMS system confirm reliable performance for a 300 μm-thick silver platelet, relatively hard ferromagnetic EuB6 single crystals down to 50 μm, and a 40 μm-thin, soft AgCrS2 single crystal. This advancement significantly broadens the applicability of capacitance dilatometry, providing a powerful platform for investigating emergent phenomena in reduced-dimensional quantum systems.