Aging Kinetics and Activation Energy-Based Modeling of Electrical Conductivity Evolution in a Cu–4Ti Alloy

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Publication Details

Journal
Apollo (University of Cambridge)
Published
2025-11-25
Primary Topic
Copper Interconnects and Reliability
Type
article
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article

Aging Kinetics and Activation Energy-Based Modeling of Electrical Conductivity Evolution in a Cu–4Ti Alloy

YingTang Zhang, Guojin Sun, Wenbin Wu, Qi Wang et al.
Apollo (University of Cambridge)
Copper Interconnects and Reliability
article

Aging Kinetics and Activation Energy-Based Modeling of Electrical Conductivity Evolution in a Cu–4Ti Alloy

YingTang Zhang, Guojin Sun, Wenbin Wu, Qi Wang, Hong Liu
article en

Abstract

No abstract available for this paper.
Apollo (University of Cambridge)
Affordable and clean energy
Openalex Percentile: Top 48%
Copper Interconnects and Reliability
OpenAlex
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Aging Kinetics and Activation Energy-Based Modeling of Electrical Conductivity Evolution in a Cu–4Ti Alloy — YingTang Zhang, Guojin Sun, et al. · Apollo (University of Cambridge) (2025) | TGRS Research Map | TGRS