Diamond-Scanning Nitrogen-Vacancy Center Probe Microscope

The principle of the diamond-scanning nitrogen-vacancy (NV) center probe microscope is introduced, along with our method for fabricating an NV center-containing pillar probe using laser cutting and focused ion beam milling. The NV center probe attached to the apex of a tuning-fork-based atomic force microscope (AFM) enables simultaneous imaging of an AFM topography and an optically detected magnetic resonance signal. Stray magnetic-field detection from magnetic samples and their structures imaging is demonstrated.