Adversarial Example Generation Method Based on Wavelet Transform
Adversarial examples are crucial tools for assessing the robustness of deep neural networks (DNNs) and revealing potential security vulnerabilities. Adversarial example generation methods based on Generative Adversarial Networks (GANs) have made significant progress in generating image adversarial examples, but still suffer from insufficient sparsity and transferability. To address these issues, this study proposes a novel semi-white-box untargeted adversarial example generation method named Wavelet-AdvGAN, with an explicit threat model defined as follows. Specifically, the attack is strictly untargeted without predefined target categories, aiming solely to mislead DNNs into classifying adversarial examples into any category other than the original label. It adopts a semi-white-box setting where attackers are denied access to the target model’s private information. Regarding the generator’s information dependence, the training phase only utilizes public resources (i.e., the target model’s public architecture and CIFAR-10 public training data), while the test phase generates adversarial examples through one-step feedforward of clean images without interacting with the target model. The method incorporates a Frequency Sub-band Difference (FSD) module and a Wavelet Transform Local Feature (WTLF) extraction module, evaluating the differences between original and adversarial examples from the frequency domain perspective. This approach constrains the magnitude of perturbations, reinforces feature regions, and further enhances the attack effectiveness, thereby improving the sparsity and transferability of adversarial examples. Experimental results demonstrate that the Wavelet-AdvGAN method achieves an average increase of 1.26% in attack success rates under two defense strategies—data augmentation and adversarial training. Additionally, the adversarial transferability improves by an average of 2.7%. Moreover, the proposed method exhibits a lower l0 norm, indicating better perturbation sparsity. Consequently, it effectively evaluates the robustness of deep neural networks.
Authors
- Meng Bi
- Longxin Liu
- Jianxing Liu (ORCID: https://orcid.org/0000-0002-2201-3887)
- Baiyu Wang
- Xiaoguo Liang
- Xin Yin
Institutions
- Shenyang University of Technology (CN)
- China Construction Bank (CN)
Publication Details
- Journal
- Information
- Published
- 2026-02-10
- DOI
- https://doi.org/10.3390/info17020182
- Primary Topic
- Adversarial Robustness in Machine Learning
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- State Key Laboratory of Synthetical Automation for Process Industries