Tunable magnetic sample environment at the SoftiMAX beamline
Adjustable magnetic field sources have become indispensable in advanced material characterization techniques. Among these, permanent magnet assemblies offer significant advantages by reducing power consumption and minimizing Joule heating. In this work, we report on the development and integration of a tunable magnetic sample environment at the SoftiMAX beamline of the MAX IV synchrotron, employing a "magnetic mangles" configuration of four diametrically magnetized cylindrical NdFeB permanent magnets. This arrangement provides precise control of the field strength and orientation, achieving magnitudes up to 415 mT. Both in-plane and out-of-plane magnetic field configurations were explored, including a 30° tilted orientation. Our results indicate that the highest field uniformity occurs at maximum field strengths, decreasing as the field strength approaches zero. Moreover, field sweeping configurations were explored for various field orientation angles, and the hysteretic behavior as well as the field uniformity were analyzed. The system's performance was demonstrated through x-ray microscopy experiments conducted on Co nanochains and a CoGd thin film, revealing details of magnetic domain structures and magnetization reversal processes.
Authors
- Rasmus Westerström (ORCID: https://orcid.org/0000-0003-4710-4512)
- Karina Thånell (ORCID: https://orcid.org/0000-0003-3886-9337)
- Igor Beinik (ORCID: https://orcid.org/0000-0002-4944-1398)
- Itamar T. Neckel (ORCID: https://orcid.org/0000-0003-0560-3284)
- Linus Roslund
- Mehran Sedrpooshan (ORCID: https://orcid.org/0000-0003-1230-782X)
- Claudiu Bulbucan (ORCID: https://orcid.org/0000-0003-4651-9513)
- J Schwenke
- J Brandão
Institutions
- Lund University (SE)
- MAX IV Laboratory (SE)
- Brazilian Center for Research in Energy and Materials (BR)
Publication Details
- Journal
- Review of Scientific Instruments
- Published
- 2026-02-01
- DOI
- https://doi.org/10.1063/5.0280893
- Primary Topic
- Magnetic properties of thin films
- Type
- article
- Field-Weighted Citation Impact
- 0.00