Graph Neural Network-Based Glitch Rate Prediction at the Signoff Stage

Dynamic power consumption has become a dominant concern in modern digital designs, with reports indicating that glitches can contribute up to 40% of total dynamic power consumption. Traditional approaches to evaluating glitch power, such as static analysis and dynamic simulation, face tradeoffs between accuracy and efficiency. This article presents a Graph Neural Network (GNN)-based model that leverages machine learning to estimate glitch rates. The model learns the structural and timing features of the circuit and utilizes a small set of input patterns to predict glitch rates after gate sizing-based Engineering Change Order (ECO). By integrating the predicted glitch rates with a commercial power analysis tool, the proposed method enables rapid identification of glitch hotspots, accelerating power optimization during the signoff stage. Experimental results highlight the effectiveness of the proposed model, achieving an average Root Mean Square Error (RMSE) of 0.0867 and a correlation coefficient of 0.9100 in glitch rate prediction. Moreover, the approach identifies glitch hotspots with high accuracy, correctly labeling 83.4% of the top 5% highest glitch power gates and 89.78% of the top 10%. Compared to relying solely on commercial tools for glitch power estimation within the optimization flow, the proposed method reduces runtime by an average of 35.78% when the iteration count matches the circuit’s logic level.

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Publication Details

Journal
ACM Transactions on Design Automation of Electronic Systems
Published
2025-08-14
DOI
https://doi.org/10.1145/3760779
Citations
1
Primary Topic
Low-power high-performance VLSI design
Type
article
Field-Weighted Citation Impact
0.73
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article

Graph Neural Network-Based Glitch Rate Prediction at the Signoff Stage

Ming-Chao Lee, Yung‐Chih Chen, Yen-Lin Lin
1 citations
ACM Transactions on Design Automation of Electronic Systems
Low-power high-performance VLSI design
0.73
article

Graph Neural Network-Based Glitch Rate Prediction at the Signoff Stage

Ming-Chao Lee, Yung‐Chih Chen, Yen-Lin Lin
article en
1 citations

Abstract

Dynamic power consumption has become a dominant concern in modern digital designs, with reports indicating that glitches can contribute up to 40% of total dynamic power consumption. Traditional approaches to evaluating glitch power, such as static analysis and dynamic simulation, face tradeoffs between accuracy and efficiency. This article presents a Graph Neural Network (GNN)-based model that leverages machine learning to estimate glitch rates. The model learns the structural and timing features of the circuit and utilizes a small set of input patterns to predict glitch rates after gate sizing-based Engineering Change Order (ECO). By integrating the predicted glitch rates with a commercial power analysis tool, the proposed method enables rapid identification of glitch hotspots, accelerating power optimization during the signoff stage. Experimental results highlight the effectiveness of the proposed model, achieving an average Root Mean Square Error (RMSE) of 0.0867 and a correlation coefficient of 0.9100 in glitch rate prediction. Moreover, the approach identifies glitch hotspots with high accuracy, correctly labeling 83.4% of the top 5% highest glitch power gates and 89.78% of the top 10%. Compared to relying solely on commercial tools for glitch power estimation within the optimization flow, the proposed method reduces runtime by an average of 35.78% when the iteration count matches the circuit’s logic level.

ACM Transactions on Design Automation of Electronic SystemsVol. 31(4)
Siemens (Germany) (DE), Synopsys (Switzerland) (CH), National Taiwan University of Science and Technology (TW)
Affordable and clean energy
Openalex Percentile: Top 20%
Low-power high-performance VLSI design
0.73
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Graph Neural Network-Based Glitch Rate Prediction at the Signoff Stage — Ming-Chao Lee, Yung‐Chih Chen, et al. · ACM Transactions on Design Automation of Electronic Systems (2025) | TGRS Research Map | TGRS