Near-sensor testing method for observing radiation-induced soft errors in modern sensors

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SPIRE - Sciences Po Institutional REpository
Published
2025-11-26
Primary Topic
Radiation Effects in Electronics
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article
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article

Near-sensor testing method for observing radiation-induced soft errors in modern sensors

Matheus Minelli de Carvalho, Lirida Naviner, Benjamin Cheymol, Rodrigo Possamai Bastos
SPIRE - Sciences Po Institutional REpository
Radiation Effects in Electronics
article

Near-sensor testing method for observing radiation-induced soft errors in modern sensors

Matheus Minelli de Carvalho, Lirida Naviner, Benjamin Cheymol, Rodrigo Possamai Bastos
article en

Abstract

No abstract available for this paper.
SPIRE - Sciences Po Institutional REpository
Télécom Paris (FR), Laboratoire de Physique Subatomique et de Cosmologie (FR), Institut Polytechnique de Paris (FR)
Openalex Percentile: Top 36%
Radiation Effects in Electronics
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