Implications of temporal sampling in voltage imaging microscopy.

Our work provides guidance for the selection of optimal temporal sampling parameters for voltage imaging. Most importantly it advises against using scanning voltage imaging microscopes at frame rates below 500 Hz.

Authors

Jakub Czuchnowski (ORCID: https://orcid.org/0000-0002-3854-5634)
Jerome Mertz (ORCID: https://orcid.org/0000-0002-6343-9155)

Institutions

Boston University (US)

Publication Details

Journal: PubMed
Published: 2026-01-28
Primary Topic: Integrated Circuits and Semiconductor Failure Analysis
Type: article
Field-Weighted Citation Impact: 0.00

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article

Implications of temporal sampling in voltage imaging microscopy.

Jakub Czuchnowski, Jerome Mertz

Jan 28, 2026

PubMed

Integrated Circuits and Semiconductor Failure Analysis

article

Implications of temporal sampling in voltage imaging microscopy.

Jakub Czuchnowski, Jerome Mertz

January 28, 2026article en

Abstract

PubMed

Boston University (US)

Openalex Percentile: Top 64%

Integrated Circuits and Semiconductor Failure Analysis

OpenAlex

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Implications of temporal sampling in voltage imaging microscopy. — Jakub Czuchnowski, Jerome Mertz · PubMed (2026) | TGRS Research Map | TGRS