Multidimensional Photodetection with a Broadband‐Sensitive and Polarimetric TiS <sub>3</sub> /In <sub>2</sub> S <sub>3</sub> Heterojunction

ABSTRACT The integration of broadband, polarization‐sensitive, and ultrasensitive detection into a single photodetector is highly desirable for multidimensional optoelectronics but remains challenging. This work reports a van der Waals heterojunction photodetector based on non‐layered 2D In 2 S 3 and TiS 3 that overcomes this limitation. The device operates across an ultraviolet‐to‐near‐infrared spectrum (365–1064 nm) and sets a new benchmark by unifying an exceptional detectivity (1.4 × 10 14 Jones), a strong polarization anisotropy (3.42), fast response speed (404/789 µs), and femtowatt‐level noise‐equivalent power (28.2 fW/Hz 1/2 ) at 405 nm. We reveal that unilateral depletion‐induced photogating effect is responsible for this superior performance, enabling high photoconductive gain without compromising speed. Capitalizing on these advanced capabilities, we further demonstrate its application in multidimensional photodetection, including broadband imaging, polarization‐resolved imaging, and ultralow power imaging at 0.23 pW. Furthermore, a two‐channel optical communication system is implemented using intensity and polarization as independent information carriers, underscoring its potential to enhance data transmission capacity. This work breaks the pervasive performance trade‐offs and provides a versatile platform for future multidimensional optoelectronic systems.

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Publication Details

Journal
Advanced Optical Materials
Published
2026-02-05
DOI
https://doi.org/10.1002/adom.71020
Primary Topic
2D Materials and Applications
Type
article
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article

Multidimensional Photodetection with a Broadband‐Sensitive and Polarimetric TiS 3 /In 2 S 3 Heterojunction

Ziqiao Wu, Zhifeng Zheng, Xiaofeng Li, Pu Zou et al.
Advanced Optical Materials
2D Materials and Applications
article

Multidimensional Photodetection with a Broadband‐Sensitive and Polarimetric TiS 3 /In 2 S 3 Heterojunction

Ziqiao Wu, Zhifeng Zheng, Xiaofeng Li, Pu Zou, Jiandong Yao, Yingying Niu, Yu Zhao, Mengmeng Yang, Chao Huang, Wei Gao, Dongxiang Luo, Huawen Quan, Guowei Yang
article en

Abstract

ABSTRACT The integration of broadband, polarization‐sensitive, and ultrasensitive detection into a single photodetector is highly desirable for multidimensional optoelectronics but remains challenging. This work reports a van der Waals heterojunction photodetector based on non‐layered 2D In 2 S 3 and TiS 3 that overcomes this limitation. The device operates across an ultraviolet‐to‐near‐infrared spectrum (365–1064 nm) and sets a new benchmark by unifying an exceptional detectivity (1.4 × 10 14 Jones), a strong polarization anisotropy (3.42), fast response speed (404/789 µs), and femtowatt‐level noise‐equivalent power (28.2 fW/Hz 1/2 ) at 405 nm. We reveal that unilateral depletion‐induced photogating effect is responsible for this superior performance, enabling high photoconductive gain without compromising speed. Capitalizing on these advanced capabilities, we further demonstrate its application in multidimensional photodetection, including broadband imaging, polarization‐resolved imaging, and ultralow power imaging at 0.23 pW. Furthermore, a two‐channel optical communication system is implemented using intensity and polarization as independent information carriers, underscoring its potential to enhance data transmission capacity. This work breaks the pervasive performance trade‐offs and provides a versatile platform for future multidimensional optoelectronic systems.

Advanced Optical MaterialsVol. 14(9)
Guangdong University of Technology (CN), Sun Yat-sen University (CN), South China Normal University (CN), Henan University of Technology (CN), Guangzhou University (CN), Henan University of Engineering (CN), Guangdong Polytechnic Normal University (CN), CE Technologies (United Kingdom) (GB)
Openalex Percentile: Top 66%
2D Materials and Applications
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