Revealing the Role of Internal Strain Behavior on Stabilizing High Voltage LiCoO <sub>2</sub> ‐Based All‐Solid‐State Thin Film Batteries (Adv. Funct. Mater. 11/2026)
All-Solid-State Thin-Film Batteries In their Research Article (10.1002/adfm.202520552), Yanhua Cui and co-workers evaluate the effects of growth strain relaxation and intragranular structure defect distribution on the reversible structural phase transition for high-voltage thin-film cathodes. The image depicts that the longitudinal transition metal layer can be locked by the robust substrate layer, protecting the host structure against distortion and holding long-term cycle life.
Authors
- Tong Wu (ORCID: https://orcid.org/0000-0002-7474-6943)
- Jinxu Qiu (ORCID: https://orcid.org/0009-0000-5287-4680)
- Yuezhen Hua
- Yaxuan He
- Qi Wu (ORCID: https://orcid.org/0000-0001-7734-0749)
- Hongliang Li
- Keyu Xie
- Yanhua Cui
- Jie Shu
- Yu Zhao
- Yongmin Wu
Institutions
- Ningbo University (CN)
- Northwestern Polytechnical University (CN)
- China Academy of Engineering Physics (CN)
- Primary Source (US)
- Center for High Pressure Science and Technology Advanced Research (CN)
- Tsinghua University (CN)
Publication Details
- Journal
- Advanced Functional Materials
- Published
- 2026-02-01
- DOI
- https://doi.org/10.1002/adfm.73797
- Primary Topic
- Advancements in Battery Materials
- Type
- article
- Field-Weighted Citation Impact
- 0.00