Remaining Useful Life Prediction of Electronic Power Components Based on a Hybrid Model Combining Bidirectional Long Short-Term Memory Networks and Gaussian Process Regression

The performance degradation of electronic power components during long-term operation can compromise system reliability and safety. Therefore, accurately predicting their remaining useful life (RUL) is critical for the reliability of safety-critical systems that utilize these components. This paper proposes a hybrid model integrating bidirectional long short-term memory networks (BiLSTM) and Gaussian process regression (GPR) for RUL prediction of electronic power components. The BiLSTM module provides high-precision point predictions, while the GPR module leverages the sequence features and trend information extracted by BiLSTM to deliver reliable interval predictions and high-confidence probabilistic outputs. The model’s predictive accuracy was validated using NASA’s publicly available lithium-ion battery dataset. Experimental results demonstrate that, compared to existing models, the proposed model achieves at least a 9.6% improvement in point prediction performance and a 63% improvement in interval prediction performance, fully validating the reliability and accuracy of the BiLSTM-GPR approach. The model was further applied to predict the RUL of DC-DC power modules. The predicted Continuous Ranked Probability Score (CRPS) reached a maximum of 0.050405, while the Probability Integral Transform (PIT) results exhibited a uniform distribution within the (0,1) range, further demonstrating the model’s high reliability and predictive confidence.