Defect Engineering in Large‐Scale CVD‐Grown Hexagonal Boron Nitride: Formation, Spectroscopy, and Spin Relaxation Dynamics (Small 8/2026)
Defect Engineering Optically active defects in hexagonal boron nitride have become a versatile platform for advancing quantum technologies. Defect formation in this 2D material depends on the energy and type of bombarding particles and their interactions with underlying substrates. Suspended samples enable more controlled defect engineering, demonstrated on large-scale CVD films. More in article number e06874, Ivan V. Vlassiouk and co-workers.
Authors
- Sujoy Ghosh (ORCID: https://orcid.org/0000-0003-2894-8971)
- Huan Zhao (ORCID: https://orcid.org/0000-0002-4982-0865)
- Ivan Vlassiouk (ORCID: https://orcid.org/0000-0002-5494-0386)
- Steven Randolph (ORCID: https://orcid.org/0000-0001-9707-4337)
- Ying Jiang (ORCID: https://orcid.org/0000-0002-6887-5503)
- Bogdan Dryzhakov (ORCID: https://orcid.org/0000-0002-2156-4396)
- Nickolay V. Lavrik (ORCID: https://orcid.org/0000-0002-9543-5634)
- David Glasgow (ORCID: https://orcid.org/0000-0002-6334-3639)
- Alexander A. Puretzky (ORCID: https://orcid.org/0000-0002-9996-4429)
- Kai Xiao (ORCID: https://orcid.org/0009-0002-1033-4023)
- Liam Collins (ORCID: https://orcid.org/0000-0003-4946-9195)
- Harry M. Meyer (ORCID: https://orcid.org/0000-0003-4994-1664)
- Martí Checa (ORCID: https://orcid.org/0000-0003-2607-6866)
- John Lasseter (ORCID: https://orcid.org/0000-0001-8231-1125)
- Andrew R. Lupini (ORCID: https://orcid.org/0000-0002-1874-7925)
- Farzana Hasan Likhi (ORCID: https://orcid.org/0009-0007-4732-284X)
- Ian Gallagher (ORCID: https://orcid.org/0000-0003-3504-5594)
- Ondrej Dyck
- Yueh‐Chun Wu
- Benjamin Lawrie
- Ilia Ivanov
- Alexander Tselev
- Sergei Smirnov
Institutions
- New Mexico State University (US)
- Oak Ridge National Laboratory (US)
- University of Houston (US)
- University of Aveiro (PT)
Publication Details
- Journal
- Small
- Published
- 2026-02-01
- DOI
- https://doi.org/10.1002/smll.72117
- Primary Topic
- Graphene research and applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00