Mass-unspecific classifiers for mass-dependent searches

Abstract Searches for new particles often span a wide range of mass scales, where the shape of potential signals and the SM background varies significantly. We make use of a multivariate method that fully exploits the correlation between signal and background features and the explored mass scale, and is trained on a sample that is balanced across the entire mass range. The classifiers, either a neural network or a boosted decision tree, produce a continuous output across the full mass range and, at a given mass, achieve nearly the same performance as a classifier specifically trained for that mass. The performance of the classifiers is better than the one obtained with parameterised neural networks and similar methods.

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Publication Details

Journal
The European Physical Journal C
Published
2026-02-04
DOI
https://doi.org/10.1140/epjc/s10052-026-15314-x
Primary Topic
Advanced Electron Microscopy Techniques and Applications
Type
article
Field-Weighted Citation Impact
0.00

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article

Mass-unspecific classifiers for mass-dependent searches

J. A. Aguilar-Saavedra, S. Rodríguez-Benítez
The European Physical Journal C
Advanced Electron Microscopy Techniques and Applications
article

Mass-unspecific classifiers for mass-dependent searches

J. A. Aguilar-Saavedra, S. Rodríguez-Benítez
article en

Abstract

Abstract Searches for new particles often span a wide range of mass scales, where the shape of potential signals and the SM background varies significantly. We make use of a multivariate method that fully exploits the correlation between signal and background features and the explored mass scale, and is trained on a sample that is balanced across the entire mass range. The classifiers, either a neural network or a boosted decision tree, produce a continuous output across the full mass range and, at a given mass, achieve nearly the same performance as a classifier specifically trained for that mass. The performance of the classifiers is better than the one obtained with parameterised neural networks and similar methods.

The European Physical Journal CVol. 86(2)
Instituto de Física Teórica (ES)
Agencia Estatal de Investigación
Peace, Justice and strong institutions
Openalex Percentile: Top 72%
Advanced Electron Microscopy Techniques and Applications
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