Symmetry Breaking and Reinforcement-Induced Non-Alter Spin Splitting in Antiferromagnet for Low-Power and High-Density Memory
Altermagnets, due to spontaneous spin splitting induced by the breaking of the <i>PT</i> inversion symmetry, are now widely used in the design of novel antiferromagnetic (AFM) spintronic devices. Herein, we demonstrate symmetry breaking in AFM via slip and strain engineering, achieving a non-alter spin splitting compensated magnet. As a demo concept, a four-layer sliding strategy in GdI<sub>2</sub> is put forward, enabling sliding-induced ferroelectric (FE) and magnetic switching. The FE polarization breaks <i>PT</i> symmetry, inducing spin-split band structures that drive AFM to ferromagnetic (FM) phase transformation or nonrelativistic spin-splitting (NRSS) AFM. The designed multiferroic tunnel junction demonstrates electric-field-controlled four-state resistance switching with low resistance area. The regulation effect of strain on the device's transport properties has also been simulated. The compressive strain enhances the crystal symmetry in the FE-FM phase, triggering an FM-NRSS-mediated AFM transition and boosting tunneling electromagnetic resistance, providing a novel strategy and mechanism for developing low-power, high-density memory devices.
Authors
- Hui Xing
- Fangqi Liu
- Jian Wang (ORCID: https://orcid.org/0000-0002-7945-0826)
- Shichen Zhang (ORCID: https://orcid.org/0000-0003-3688-3717)
- Guorong Yu (ORCID: https://orcid.org/0009-0002-5437-2718)
- Chuan Xie
- Sicong Zhu
- Chunmin Ning
- Rui Xiong
Institutions
- Karlsruhe Institute of Technology (DE)
- Ministry of Education of the People's Republic of China (CN)
- China Iron and Steel Research Institute Group (CN)
- Wuhan University (CN)
- Helmholtz-Institute Ulm (DE)
- Wuhan University of Science and Technology (CN)
Publication Details
- Journal
- Nano Letters
- Published
- 2026-02-04
- DOI
- https://doi.org/10.1021/acs.nanolett.5c05031
- Primary Topic
- Multiferroics and related materials
- Type
- article
- Field-Weighted Citation Impact
- 0.00