Extrinsic Limitations of Stealthy Hyperuniform Devices

ABSTRACT Hyperuniformity promises an unusual form of wave control: the suppression of elastic scattering over extended angular ranges without periodic order. Here, we present a comprehensive experimental and theoretical study of 2D stealthy hyperuniform metasurfaces operating at optical frequencies. In agreement with theoretical expectations, we observe a pronounced reduction of elastic scattering around the specular direction in metasurfaces fabricated by electron‐beam lithography. However, the measured suppression is substantially weaker than that predicted by structure‐factor calculations based on ideal stealthy hyperuniform point‐pattern generators. We identify and quantitatively analyze the physical origins of this discrepancy and establish realistic performance bounds. By isolating the dominant limiting mechanisms, our results provide practical design guidelines for the implementation of stealthy hyperuniformity in functional devices.

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Publication Details

Journal
Advanced Optical Materials
Published
2026-09-18
DOI
https://doi.org/10.1002/adom.71800
Primary Topic
Metamaterials and Metasurfaces Applications
Type
article
Field-Weighted Citation Impact
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article

Extrinsic Limitations of Stealthy Hyperuniform Devices

Louis Forestier, F. Carcenac, Yuhao Xu, Laurent Mazenq et al.
Advanced Optical Materials
Metamaterials and Metasurfaces Applications
article

Extrinsic Limitations of Stealthy Hyperuniform Devices

Louis Forestier, F. Carcenac, Yuhao Xu, Laurent Mazenq, Miao Chen, Philippe Lalanne
article en

Abstract

ABSTRACT Hyperuniformity promises an unusual form of wave control: the suppression of elastic scattering over extended angular ranges without periodic order. Here, we present a comprehensive experimental and theoretical study of 2D stealthy hyperuniform metasurfaces operating at optical frequencies. In agreement with theoretical expectations, we observe a pronounced reduction of elastic scattering around the specular direction in metasurfaces fabricated by electron‐beam lithography. However, the measured suppression is substantially weaker than that predicted by structure‐factor calculations based on ideal stealthy hyperuniform point‐pattern generators. We identify and quantitatively analyze the physical origins of this discrepancy and establish realistic performance bounds. By isolating the dominant limiting mechanisms, our results provide practical design guidelines for the implementation of stealthy hyperuniformity in functional devices.

Advanced Optical Materials
Centre National de la Recherche Scientifique (FR), Université Fédérale de Toulouse Midi-Pyrénées (FR), Laboratoire d'Analyse et d'Architecture des Systèmes (FR), Laboratoire Photonique, Numérique et Nanosciences (FR)
Openalex Percentile: Top 95%
Metamaterials and Metasurfaces Applications
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Extrinsic Limitations of Stealthy Hyperuniform Devices — Louis Forestier, F. Carcenac, et al. · Advanced Optical Materials (2026) | TGRS Research Map | TGRS