Extrinsic Limitations of Stealthy Hyperuniform Devices
ABSTRACT Hyperuniformity promises an unusual form of wave control: the suppression of elastic scattering over extended angular ranges without periodic order. Here, we present a comprehensive experimental and theoretical study of 2D stealthy hyperuniform metasurfaces operating at optical frequencies. In agreement with theoretical expectations, we observe a pronounced reduction of elastic scattering around the specular direction in metasurfaces fabricated by electron‐beam lithography. However, the measured suppression is substantially weaker than that predicted by structure‐factor calculations based on ideal stealthy hyperuniform point‐pattern generators. We identify and quantitatively analyze the physical origins of this discrepancy and establish realistic performance bounds. By isolating the dominant limiting mechanisms, our results provide practical design guidelines for the implementation of stealthy hyperuniformity in functional devices.
Authors
- Louis Forestier
- F. Carcenac (ORCID: https://orcid.org/0000-0002-9660-9931)
- Yuhao Xu
- Laurent Mazenq
- Miao Chen
- Philippe Lalanne
Institutions
- Centre National de la Recherche Scientifique (FR)
- Université Fédérale de Toulouse Midi-Pyrénées (FR)
- Laboratoire d'Analyse et d'Architecture des Systèmes (FR)
- Laboratoire Photonique, Numérique et Nanosciences (FR)
Publication Details
- Journal
- Advanced Optical Materials
- Published
- 2026-09-18
- DOI
- https://doi.org/10.1002/adom.71800
- Primary Topic
- Metamaterials and Metasurfaces Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00