Multiparameter Sensor for Measuring a Spacecraft Surface’s Contamination Parameters

The article presents a multiparameter sensor designed to monitor the contamination of the surface of a spacecraft. The design and structural diagram of the device are described, including a quartz microbalance for measuring mass deposits and an impedance sensor for assessing the thickness of the deposited film and the dielectric properties of contaminants. Measurement methods are provided as well as the results of laboratory tests confirming the effectiveness of the proposed solution. The development allows for prompt monitoring of the degree of contamination and its nature, which is important for ensuring the reliability of the spacecraft under the influence of external factors.