Design Phase-Locked Loop Using a Continuous-Time Bandpass Delta-Sigma Time-to-Digital Converter

This paper presents an all-digital fractional-N phase-locked loop (ADPLL) operating in the 2.86–3.2 GHz range, optimized for IoT and high-frequency RF transceiver applications demanding stringent phase noise performance, fast settling time, and high integration capability. The key innovation lies in the introduction of a bandpass delta-sigma time-to-digital converter (BPDSTDC) that achieves high-resolution phase detection, an extended detection range of ±2π, and superior noise-shaping characteristics, completely eliminating the complex calibration procedures typically required in conventional TDC designs. The proposed architecture synergistically combines the BPDSTDC with digital down-conversion blocks to extract phase error at baseband, a divider chain integrated with phase interpolators achieving 1/4 fractional resolution to suppress in-band quantization noise, and a wide-bandwidth digital loop filter (>1 MHz) ensuring fast dynamic response and robust stability. The bandpass delta-sigma modulator is implemented with compact resonator structures and a flash quantizer, achieving an optimal balance among resolution, power consumption, and silicon area. The incorporation of highly linear phase interpolators extends fractional frequency synthesis capability without requiring complex digital-to-time converters (DTCs), significantly reducing design complexity and calibration overhead. Fabricated in a 180-nm CMOS technology, the proposed chip demonstrates robust measured performance. The band-pass delta-sigma TDC achieves a low integrated rms timing noise of 183 fs within a 1-MHz bandwidth. Leveraging this low TDC noise, the complete ADPLL exhibits a measured in-band phase noise of −120 dBc/Hz at a 1-MHz offset for a 3.2-GHz output frequency while operating with a loop bandwidth exceeding 1 MHz. This corresponds to a normalized phase noise of −216 dBc/Hz. The system operates from a 1.8-V supply and consumes 10 mW, achieving competitive performance compared with prior noise-shaping TDC-based all-digital PLLs.