Nanoscale Localization Microscopy and Deterministic Lithography of Solid-State Quantum Emitters

Quantum emitters (QEs) in the solid state can be spatially aligned with nanostructures to increase the photon collection efficiency and radiative emission rate. In many promising material platforms, these QEs are randomly positioned over the sample area, necessitating precise mapping of the emitter location and subsequent agile lithography aligned with the source. We have developed a programmable confocal microscope system to localize QEs with subwavelength precision, and subsequently accurately define nanostructures around the emitters. We show that repeated sampling of emitter location relative to alignment markers can account for sample drift and localize the emitter position within a few tens of nanometers. We demonstrate the deterministic enhancement of the collected photon intensity by up to 84% for emitters embedded in a micropillar.

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Publication Details

Journal
ACS Photonics
Published
2026-02-03
DOI
https://doi.org/10.1021/acsphotonics.5c02864
Primary Topic
Near-Field Optical Microscopy
Type
article
Field-Weighted Citation Impact
0.00

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article

Nanoscale Localization Microscopy and Deterministic Lithography of Solid-State Quantum Emitters

Hüseyin Bilge Yağcı, Rachel N. Clark, Sam G. Bishop, John P. Hadden et al.
ACS Photonics
Near-Field Optical Microscopy
article

Nanoscale Localization Microscopy and Deterministic Lithography of Solid-State Quantum Emitters

Hüseyin Bilge Yağcı, Rachel N. Clark, Sam G. Bishop, John P. Hadden, Anthony J. Bennett
article en

Abstract

Quantum emitters (QEs) in the solid state can be spatially aligned with nanostructures to increase the photon collection efficiency and radiative emission rate. In many promising material platforms, these QEs are randomly positioned over the sample area, necessitating precise mapping of the emitter location and subsequent agile lithography aligned with the source. We have developed a programmable confocal microscope system to localize QEs with subwavelength precision, and subsequently accurately define nanostructures around the emitters. We show that repeated sampling of emitter location relative to alignment markers can account for sample drift and localize the emitter position within a few tens of nanometers. We demonstrate the deterministic enhancement of the collected photon intensity by up to 84% for emitters embedded in a micropillar.

ACS PhotonicsVol. 13(4)
Translational Research Institute (AU), University of Bristol (GB), Quantum Technologies (Sweden) (SE), Cardiff University (GB)
European Commission, Horizon 2020 Framework Programme, Engineering and Physical Sciences Research Council
Affordable and clean energy
Openalex Percentile: Top 68%
Near-Field Optical Microscopy
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