Soft X-ray emission of nickel silicides and nickel aluminides

Measurements are presented of the Si and Al L X-ray emission bands of Ni silicides (Ni31Si12 and Ni2Si) and Ni aluminides (Ni2Al3 and NiAl3). The spectra, obtained with a soft X-ray spectrometer and electron beam excitation, reflect the distribution of Si and Al s- and d-states in the valence band. The experimental spectra are compared with X-ray emission spectra calculated from the local and partial densities of states obtained with density functional theory.