Thickness-dependent structural and magnetic properties of

Multifunctional materials combining electric and magnetic ordering have garnered significant attention due to their potential in next-generation electronic devices, especially in spintronics. The exchange bias (EB) effect, which comes from the combination of ferromagnetic (FM) and antiferromagnetic (AFM) materials, is very important for how well devices work. In this study, bilayer thin films of Pr2NiMnO6 (PNMO) and NdFeO3 (NFO) were fabricated using pulsed-laser deposition on SrTiO3 substrates. The effects of varying the PNMO layer thickness on crystal structure, magnetism, and exchange bias were systematically investigated. X-ray diffraction confirmed epitaxial growth, while magnetic measurements revealed the impact of interfacial strain on exchange coupling. The results show that making the PNMO layer thicker improves the exchange bias (EB), mainly because it reduces strain at the interface and helps align the magnetic domains better. This finding emphasizes the future promise of multiferroic materials for advanced applications in spintronic devices.