Van der Waals Ferroelectric CuInP <sub>2</sub> S <sub>6</sub> ‐based Multi‐slope In‐memory Probabilistic Computing
Probabilistic bit (p-bit) is the fundamental building block and core element of probabilistic computing (p-computing). However, physical separation of bit generation and memory storage creates a memory bottleneck in conventional p-computing architectures. We report on experimentally integrating voltage-tunable stochastic bit generation and non-volatile memory functionalities within a single in-memory device to realize a p-bit with van der Waals ferroelectric CuInP<sub>2</sub>S<sub>6</sub> (CIPS). Leveraging the stochastic displacement of Cu<sup>+</sup> ions and the material's remanent polarization under an external electric field, the proposed device achieves stable random bit retention (>1000 s) with low power consumption (∼75 nW). This eliminates the need for data transfer between separate memory and logic units, thereby enabling efficient in-memory p-computing with improved system-level performance. In-memory p-computing outperforms conventional p-computing in device-to-system-level NP-hard simulations, reducing time-complexity from O(n<sup>2</sup>) to O(n<sup>1.5</sup>). Notably, the sigmoid slope of the probabilistic output is dynamically tuned by varying the CIPS layer thickness, enabling adaptive control over exploration-exploitation characteristics. Broader slopes facilitate initial exploration, whereas steeper slopes support rapid convergence in later stages. Sigmoid slope tunability over a wide dynamic range (6.17-38.41) reduces convergence steps by 400-fold, highlighting the potential of CIPS-based p-bit as a compact, energy-efficient platform for scalable and adaptive p-computing.
Authors
- Chang Yong Park
- Namju Kim
- Sang-Yoep Lee
- Seongkweon Kang
- Sungjoo Lee
Institutions
- Kyungpook National University (KR)
- Sungkyunkwan University (KR)
Publication Details
- Journal
- Advanced Materials
- Published
- 2026-01-30
- DOI
- https://doi.org/10.1002/adma.202518284
- Primary Topic
- Ferroelectric and Negative Capacitance Devices
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Research Foundation
- Sungkyunkwan University
- Ministry of Trade, Industry and Energy
- Ministry of Science, ICT and Future Planning
- Korea Institute for Advancement of Technology
- National Research Foundation of Korea
- Samsung