Enhancing reciprocal space resolution in MeV ultrafast electron diffraction with permanent magnet lenses

Ultrafast electron diffraction (UED) probes structural dynamics on femtosecond timescales and angstrom spatial scales. Artificial crystals are a novel experimental target for UED beams. Typically composed of lattice-mismatched atomic layers, the repeating atomic patterns in artificial crystals can have periods several nanometers in length, which produces intricate satellite features in the electron diffraction pattern. Resolving fascinating satellite diffraction peaks in a compact UED beamline requires high angular magnification. In this work, we describe the implementation of post-sample angular magnification using a pair of compact permanent magnet solenoid lenses. Configured as an objective-eyepiece pair, these lenses achieve a camera length of 50 meters, i.e., the lens system is equivalent to extending the beamline drift length by a factor 15. We demonstrate the advantages of this scheme with data that resolves satellite diffraction peaks in a heterostructure sample.

Authors

Publication Details

Journal
JACOW
Published
2026-01-29
DOI
https://doi.org/10.18429/jacow-napac2025-tup037
Primary Topic
Advanced Electron Microscopy Techniques and Applications
Type
article
Field-Weighted Citation Impact
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article

Enhancing reciprocal space resolution in MeV ultrafast electron diffraction with permanent magnet lenses

Burak Güzeltürk, R. J. England, Paul Denham, Tong Xu et al.
JACOW
Advanced Electron Microscopy Techniques and Applications
article

Enhancing reciprocal space resolution in MeV ultrafast electron diffraction with permanent magnet lenses

Burak Güzeltürk, R. J. England, Paul Denham, Tong Xu, Pietro Musumeci, Cameron J R Duncan
article en

Abstract

Ultrafast electron diffraction (UED) probes structural dynamics on femtosecond timescales and angstrom spatial scales. Artificial crystals are a novel experimental target for UED beams. Typically composed of lattice-mismatched atomic layers, the repeating atomic patterns in artificial crystals can have periods several nanometers in length, which produces intricate satellite features in the electron diffraction pattern. Resolving fascinating satellite diffraction peaks in a compact UED beamline requires high angular magnification. In this work, we describe the implementation of post-sample angular magnification using a pair of compact permanent magnet solenoid lenses. Configured as an objective-eyepiece pair, these lenses achieve a camera length of 50 meters, i.e., the lens system is equivalent to extending the beamline drift length by a factor 15. We demonstrate the advantages of this scheme with data that resolves satellite diffraction peaks in a heterostructure sample.

JACOW
Openalex Percentile: Top 77%
Advanced Electron Microscopy Techniques and Applications
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Enhancing reciprocal space resolution in MeV ultrafast electron diffraction with permanent magnet lenses — Burak Güzeltürk, R. J. England, et al. · JACOW (2026) | TGRS Research Map | TGRS