HCCA-SAFE: A Hybrid Cascaded Control Architecture for FPGA-Based Fault Injection in Safety-Critical Automotive SoCs
Automotive System-on-Chips (SoCs) must meet stringent functional safety standards, such as ISO 26262 and IEC 61508, to ensure reliable operation under hardware faults. FPGA-based fault injection has emerged as a practical and cost-effective technique for functional safety verification. However, instrumentation-based methods face scalability challenges when applied to the high fault densities typical of automotive SoCs. To address these challenges, we propose a hybrid cascaded fault-injection controller architecture (HCCA-SAFE) that simultaneously reduces high-fanout global nets and eliminates long serial propagation paths. The architecture constrains enable-signal cluster width and distributes control across cascaded stages, improving timing results and routability under limited FPGA resources. The proposed architecture is evaluated on multiple open-source RISC-V processor cores. On openE902, HCCA-SAFE reduces net delay from 27.276 ns to 22.535 ns and achieves 32.2% and 63.8% lower net delay compared with the representative centralized and shift-chain approaches, respectively. On openE906, the proposed HCCA-SAFE limits the net delay to 12.959 ns and reduces the maximum control-signal fanout to 1763, respectively, compared with 25.825 ns and 40.442 ns in the conventional method. On openC906, the proposed design lowers the maximum control-signal fanout from 7725 to 570 and reduces the net delay to 7.506 ns. Furthermore, HCCA-SAFE produces results fully consistent with software-based RTL simulation, while delivering substantial performance gains. Speed-up factors of 127×, 206×, and 2123× are achieved on openE902, openE906, and openC906, respectively, with efficiency improvements scaling with processor complexity These results confirm that HCCA-SAFE delivers scalable, timing-robust fault-injection control suitable for large automotive SoCs.
Authors
- Xinfang Liao (ORCID: https://orcid.org/0000-0003-0735-5106)
- Yintang Yang (ORCID: https://orcid.org/0000-0001-9745-5404)
- Yong Zhang (ORCID: https://orcid.org/0000-0003-2179-3698)
- Jiajun He (ORCID: https://orcid.org/0009-0004-0629-4692)
- Changqing Xu
- Yi Liu
- Weijie Lu
Institutions
- Xidian University (CN)
Publication Details
- Journal
- Micromachines
- Published
- 2026-01-29
- DOI
- https://doi.org/10.3390/mi17020185
- Primary Topic
- Radiation Effects in Electronics
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Science Foundation
- National Natural Science Foundation of China
- National Key Research and Development Program of China
- Basic and Applied Basic Research Foundation of Guangdong Province