Mid-infrared entanglement in 220 nm silicon
Silicon photonics in the mid-infrared is a promising platform for quantum technologies. Previous demonstrations of silicon mid-infrared quantum optics have used a 340 nm silicon layer height. In this work, we use industry-standard 220 nm silicon to implement a novel, to the best of our knowledge, photon-pair source with a peak coincidence-to-accidental ratio (CAR) of 20.9±2.9 at a net measured rate of 0.63±0.02 Hz and an inferred source efficiency of 2.85±0.04 MHz W<sup>-2</sup>. Finally, we report the first integrated mid-infrared entanglement, generating a Bell state with a fidelity of <i>F</i>=94±2<i>%</i>.
Authors
- Dominic A. Sulway (ORCID: https://orcid.org/0009-0004-4783-9281)
- Jeremy C. Adcock (ORCID: https://orcid.org/0000-0002-8923-7180)
- Samuel Gears
- Sebastian G. Currie
Institutions
- Ultrasonic Technologies (United States) (US)
- Lightwave Photonics (United States) (US)
Publication Details
- Journal
- Optics Letters
- Published
- 2026-01-29
- DOI
- https://doi.org/10.1364/ol.572784
- Primary Topic
- Quantum Information and Cryptography
- Type
- article
- Field-Weighted Citation Impact
- 0.00