Multi-Label Feature Selection Method Based on Maximum Label Complexity Ratio

Multi-label feature selection, which aims to select reliable and information-rich feature subsets from high-dimensional multi-label data, plays a critical role in data mining and pattern recognition. Conventional information-theoretic methods approximate the high-order correlation between candidate features and the multi-dimensional label set by aggregating low-order mutual information between features and individual labels. However, this strategy inherently assumes all labels are equally significant, thereby overlooking their intricate distributions. To address this limitation, we first define a novel label complexity ratio based on information entropy and mutual information. We then quantify and dynamically update this ratio for each label, accounting for varying label correlations and the differential influence of selected features. Finally, we propose a new feature selection method that jointly considers the correlation with the currently most complex label, the redundancy between candidate and already-selected features, and the interaction information among these three elements to identify a high-quality feature subset. Comprehensive experiments on nine benchmark multi-label datasets demonstrate that the proposed method achieves superior performance compared to eight state-of-the-art multi-label feature selection methods.

Authors

Institutions

Publication Details

Journal
Electronics
Published
2026-01-26
DOI
https://doi.org/10.3390/electronics15030525
Primary Topic
Text and Document Classification Technologies
Type
article
Field-Weighted Citation Impact
0.00

Funders

Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

Multi-Label Feature Selection Method Based on Maximum Label Complexity Ratio

Yu Qi Cao, Long Wang, Ping Zhang
Electronics
Text and Document Classification Technologies
article

Multi-Label Feature Selection Method Based on Maximum Label Complexity Ratio

Yu Qi Cao, Long Wang, Ping Zhang
article en

Abstract

Multi-label feature selection, which aims to select reliable and information-rich feature subsets from high-dimensional multi-label data, plays a critical role in data mining and pattern recognition. Conventional information-theoretic methods approximate the high-order correlation between candidate features and the multi-dimensional label set by aggregating low-order mutual information between features and individual labels. However, this strategy inherently assumes all labels are equally significant, thereby overlooking their intricate distributions. To address this limitation, we first define a novel label complexity ratio based on information entropy and mutual information. We then quantify and dynamically update this ratio for each label, accounting for varying label correlations and the differential influence of selected features. Finally, we propose a new feature selection method that jointly considers the correlation with the currently most complex label, the redundancy between candidate and already-selected features, and the interaction information among these three elements to identify a high-quality feature subset. Comprehensive experiments on nine benchmark multi-label datasets demonstrate that the proposed method achieves superior performance compared to eight state-of-the-art multi-label feature selection methods.

ElectronicsVol. 15(3)
Hebei University of Technology (CN), PLA Air Force Aviation University (CN)
National Natural Science Foundation of China, Natural Science Foundation of Hebei Province
Openalex Percentile: Top 78%
Text and Document Classification Technologies
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.

Multi-Label Feature Selection Method Based on Maximum Label Complexity Ratio — Yu Qi Cao, Long Wang, et al. · Electronics (2026) | TGRS Research Map | TGRS