Coupled Effects of Mg/Si Ratio and Recrystallization on Strength and Electrical Conductivity in Al-xMg-0.5Si Alloys

The strategic balance between strength and electrical conductivity in Al-Mg-Si alloys is a critical challenge that must be overcome to enable their widespread adoption as viable alternatives to copper conductors in power transmission systems. To address this, the present study comprehensively investigates model alloys with Mg/Si ratios ranging from 1.0 to 2.0. A multi-faceted experimental approach was employed, combining tailored thermo-mechanical treatments (solution treatment, cold drawing, and isothermal annealing) with comprehensive microstructural characterization techniques, including electron backscatter diffraction (EBSD) and scanning electron microscopy (SEM). The results elucidate a fundamental competitive mechanism governing property optimization: excess Mg atoms concurrently contribute to solid-solution strengthening via the formation of Cottrell atmospheres around dislocations, while simultaneously enhancing electron scattering, which is detrimental to conductivity. A critical synergy was identified at the Mg/Si ratio of 1.75, which promotes the dense precipitation of fine β″ phase while facilitating extensive recovery of high dislocation density. Furthermore, EBSD analysis confirmed the development of a microstructure comprising 74.1% high-angle grain boundaries alongside a low dislocation density (KAM ≤ 2°). This specific microstructural configuration effectively minimizes electron scattering while providing moderate grain boundary strengthening, thereby synergistically achieving an optimal balance between strength and electrical conductivity. Consequently, this work elucidates the key quantitative relationships and competitive mechanisms among composition (Mg/Si ratio), processing parameters, microstructure evolution, and final properties within the studied Al-xMg-0.5Si alloy system. These findings establish a clear design guideline and provide a fundamental understanding for developing high-performance aluminum-based conductor alloys with tailored Mg/Si ratios.

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Publication Details

Journal
Crystals
Published
2026-01-22
DOI
https://doi.org/10.3390/cryst16010078
Primary Topic
Aluminum Alloy Microstructure Properties
Type
article
Field-Weighted Citation Impact
0.00

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article

Coupled Effects of Mg/Si Ratio and Recrystallization on Strength and Electrical Conductivity in Al-xMg-0.5Si Alloys

Xingsen Zhang, Meihua Bian, Shanquan Deng, Heng Chen et al.
Crystals
Aluminum Alloy Microstructure Properties
article

Coupled Effects of Mg/Si Ratio and Recrystallization on Strength and Electrical Conductivity in Al-xMg-0.5Si Alloys

Xingsen Zhang, Meihua Bian, Shanquan Deng, Heng Chen, Junwei Zhu
article en

Abstract

The strategic balance between strength and electrical conductivity in Al-Mg-Si alloys is a critical challenge that must be overcome to enable their widespread adoption as viable alternatives to copper conductors in power transmission systems. To address this, the present study comprehensively investigates model alloys with Mg/Si ratios ranging from 1.0 to 2.0. A multi-faceted experimental approach was employed, combining tailored thermo-mechanical treatments (solution treatment, cold drawing, and isothermal annealing) with comprehensive microstructural characterization techniques, including electron backscatter diffraction (EBSD) and scanning electron microscopy (SEM). The results elucidate a fundamental competitive mechanism governing property optimization: excess Mg atoms concurrently contribute to solid-solution strengthening via the formation of Cottrell atmospheres around dislocations, while simultaneously enhancing electron scattering, which is detrimental to conductivity. A critical synergy was identified at the Mg/Si ratio of 1.75, which promotes the dense precipitation of fine β″ phase while facilitating extensive recovery of high dislocation density. Furthermore, EBSD analysis confirmed the development of a microstructure comprising 74.1% high-angle grain boundaries alongside a low dislocation density (KAM ≤ 2°). This specific microstructural configuration effectively minimizes electron scattering while providing moderate grain boundary strengthening, thereby synergistically achieving an optimal balance between strength and electrical conductivity. Consequently, this work elucidates the key quantitative relationships and competitive mechanisms among composition (Mg/Si ratio), processing parameters, microstructure evolution, and final properties within the studied Al-xMg-0.5Si alloy system. These findings establish a clear design guideline and provide a fundamental understanding for developing high-performance aluminum-based conductor alloys with tailored Mg/Si ratios.

CrystalsVol. 16(1)
Guangxi University
Openalex Percentile: Top 80%
Aluminum Alloy Microstructure Properties
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