Machine Learning Inversion Method for Elastoplastic Constitutive Parameters of Encapsulation Materials

Accurate measurement of material mechanics parameters is crucial for evaluating process quality and product reliability and is a major challenge in the development of 3D heterogeneous integration technology. Aiming to perform high-accuracy measurements of the elastoplastic nonlinear constitutive parameters of microelectronic materials using the nanoindentation testing technique, we take advantage of a neural network to construct a forward characterization model to characterize these response characteristic parameters for different materials, design an improved algorithm for obtaining a reverse iterative solution of the forward characterization model, and develop a material mechanics parameter measurement method to solve overdetermined equations using the least-squares method. This method was further improved by addressing the issues of algorithm stability and solution uniqueness, achieving high-precision and fast reverse solutions for elastoplastic constitutive parameters. The relative error of the material parameters is less than 3% (95% confidence interval), the maximum error is less than 8%, and the inversion convergence error of the key indentation response characteristic parameters is less than 0.1%. The difference between the measured material parameters and the theoretical model in the influence on the process stress of TCV (through ceramic via) products is verified through finite element simulation.

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Publication Details

Journal
Nanomaterials
Published
2026-01-25
DOI
https://doi.org/10.3390/nano16030161
Primary Topic
Metal and Thin Film Mechanics
Type
article
Field-Weighted Citation Impact
0.00

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article

Machine Learning Inversion Method for Elastoplastic Constitutive Parameters of Encapsulation Materials

J. Zhang, Ce Zeng, mingqi Gao, Yong Zhang et al.
Nanomaterials
Metal and Thin Film Mechanics
article

Machine Learning Inversion Method for Elastoplastic Constitutive Parameters of Encapsulation Materials

J. Zhang, Ce Zeng, mingqi Gao, Yong Zhang, Yuan Li, Dongyang Lei, Tong Hu, You Wang
article en

Abstract

Accurate measurement of material mechanics parameters is crucial for evaluating process quality and product reliability and is a major challenge in the development of 3D heterogeneous integration technology. Aiming to perform high-accuracy measurements of the elastoplastic nonlinear constitutive parameters of microelectronic materials using the nanoindentation testing technique, we take advantage of a neural network to construct a forward characterization model to characterize these response characteristic parameters for different materials, design an improved algorithm for obtaining a reverse iterative solution of the forward characterization model, and develop a material mechanics parameter measurement method to solve overdetermined equations using the least-squares method. This method was further improved by addressing the issues of algorithm stability and solution uniqueness, achieving high-precision and fast reverse solutions for elastoplastic constitutive parameters. The relative error of the material parameters is less than 3% (95% confidence interval), the maximum error is less than 8%, and the inversion convergence error of the key indentation response characteristic parameters is less than 0.1%. The difference between the measured material parameters and the theoretical model in the influence on the process stress of TCV (through ceramic via) products is verified through finite element simulation.

NanomaterialsVol. 16(3)
University of Electronic Science and Technology of China (CN), Tianjin University (CN), China Electronics Technology Group Corporation (CN)
National Natural Science Foundation of China, University of Electronic Science and Technology of China
Industry, innovation and infrastructure
Openalex Percentile: Top 77%
Metal and Thin Film Mechanics
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Machine Learning Inversion Method for Elastoplastic Constitutive Parameters of Encapsulation Materials — J. Zhang, Ce Zeng, et al. · Nanomaterials (2026) | TGRS Research Map | TGRS