Defective Wheat Kernel Recognition Using EfficientNet with Attention Mechanism and Multi-Binary Classification

As a globally significant food crop, the assessment of wheat quality is essential for ensuring food security and enhancing the processing quality of agricultural products. Conventional methods for assessing wheat kernel quality are often inefficient and markedly subjective, which hampers their ability to accurately distinguish the complex and diverse phenotypic characteristics of wheat kernels. To tackle the aforementioned issues, this study presents an enhanced recognition method for defective wheat kernels, based on the EfficientNet-B1 architecture. Building upon the original EfficientNet-B1 network structure, this approach incorporates the lightweight attention mechanism known as CBAM (Convolutional Block Attention Module) to augment the model’s capacity to discern features in critical regions. Simultaneously, it modifies the classification head structure to facilitate better alignment with the data, thereby enhancing accuracy. The experiment employs a self-constructed dataset comprising five categories of wheat kernels—perfect wheat kernels, insect-damaged wheat kernels, scab-damaged wheat kernels, moldy wheat kernels, and black germ wheat kernels—which are utilized for training and validation purposes. The results indicate that the enhanced model attains a classification accuracy of 99.80% on the test set, reflecting an increase of 2.6% compared to its performance prior to the enhancement. Furthermore, the Precision, Recall, and F1-score all demonstrated significant improvements. The proposed model achieves near-perfect performance on several categories under controlled experimental conditions, with particularly high precision and recall for scab-damaged and insect-damaged kernels. This study demonstrates the efficacy of the enhanced EfficientNet-B1 model in the recognition of defective wheat kernels and offers novel technical insights and methodological references for intelligent wheat quality assessment.

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Publication Details

Journal
Applied Sciences
Published
2026-01-26
DOI
https://doi.org/10.3390/app16031247
Primary Topic
Spectroscopy and Chemometric Analyses
Type
article
Field-Weighted Citation Impact
0.00

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article

Defective Wheat Kernel Recognition Using EfficientNet with Attention Mechanism and Multi-Binary Classification

D. S. Wang, Han Gong, Jizhong Li, Jianyi Chen
Applied Sciences
Spectroscopy and Chemometric Analyses
article

Defective Wheat Kernel Recognition Using EfficientNet with Attention Mechanism and Multi-Binary Classification

D. S. Wang, Han Gong, Jizhong Li, Jianyi Chen
article en

Abstract

As a globally significant food crop, the assessment of wheat quality is essential for ensuring food security and enhancing the processing quality of agricultural products. Conventional methods for assessing wheat kernel quality are often inefficient and markedly subjective, which hampers their ability to accurately distinguish the complex and diverse phenotypic characteristics of wheat kernels. To tackle the aforementioned issues, this study presents an enhanced recognition method for defective wheat kernels, based on the EfficientNet-B1 architecture. Building upon the original EfficientNet-B1 network structure, this approach incorporates the lightweight attention mechanism known as CBAM (Convolutional Block Attention Module) to augment the model’s capacity to discern features in critical regions. Simultaneously, it modifies the classification head structure to facilitate better alignment with the data, thereby enhancing accuracy. The experiment employs a self-constructed dataset comprising five categories of wheat kernels—perfect wheat kernels, insect-damaged wheat kernels, scab-damaged wheat kernels, moldy wheat kernels, and black germ wheat kernels—which are utilized for training and validation purposes. The results indicate that the enhanced model attains a classification accuracy of 99.80% on the test set, reflecting an increase of 2.6% compared to its performance prior to the enhancement. Furthermore, the Precision, Recall, and F1-score all demonstrated significant improvements. The proposed model achieves near-perfect performance on several categories under controlled experimental conditions, with particularly high precision and recall for scab-damaged and insect-damaged kernels. This study demonstrates the efficacy of the enhanced EfficientNet-B1 model in the recognition of defective wheat kernels and offers novel technical insights and methodological references for intelligent wheat quality assessment.

Applied SciencesVol. 16(3)
Qingdao Agricultural University (CN), Culture Resource (EG), Beijing University of Agriculture (CN), China Agricultural University (CN)
Natural Science Foundation of Shandong Province
Zero hunger
Openalex Percentile: Top 76%
Spectroscopy and Chemometric Analyses
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