Predictive Modeling in Semiconductor Manufacturing: A Systematic Review of Cycle Time Prediction, Anomaly Detection, and Digital Twin Integration
Authors
- Adrien Wartelle (ORCID: https://orcid.org/0000-0003-1471-0866)
- T.-E. Korabi
- J. J. R. M. van Heugten (ORCID: https://orcid.org/0000-0003-1596-3240)
- Claude Yugma (ORCID: https://orcid.org/0000-0001-7749-0480)
- Renaud Roussel
- Pascal Robert
- Stéphane Dauzère-Pérès
Institutions
- Mines Saint-Étienne (FR)
- STMicroelectronics (France) (FR)
- Santa Cruz County Office of Education (US)