Towards Process Optimization by Leveraging Relationships Between Electrical Wafer Sorting and Complete-Line Statistical Process Control Data

Authors

Dmitrii Fomin (ORCID: https://orcid.org/0000-0001-7388-460X)
Anastasiia Doinychko
Daniele Vinciguerra (ORCID: https://orcid.org/0000-0003-0755-2951)
David Lemoine
Valéria Borodin
Daniele Pagano (ORCID: https://orcid.org/0000-0003-4070-454X)
Gabriele Tochino
Agnès Roussy
Andres Torres
Marco Stefano Scroppo

Institutions

Centre National de la Recherche Scientifique (FR)
STMicroelectronics (Switzerland) (CH)
Mines Saint-Étienne (FR)
STMicroelectronics (Czechia) (CZ)
IMT Atlantique (FR)
Siemens (France) (FR)
Siemens Healthcare (United States) (US)

Publication Details

Published: 2025-12-07
DOI: https://doi.org/10.1109/wsc68292.2025.11338957
Primary Topic: Advanced Statistical Process Monitoring
Type: article
Field-Weighted Citation Impact: 0.00

Controls

|||

ALL TIME

JAN

FEB

MAR

APR

MAY

JUN

JUL

AUG

SEP

OCT

article

Towards Process Optimization by Leveraging Relationships Between Electrical Wafer Sorting and Complete-Line Statistical Process Control Data

Dmitrii Fomin, Anastasiia Doinychko, Daniele Vinciguerra, David Lemoine et al.

Dec 7, 2025

Advanced Statistical Process Monitoring

article

Towards Process Optimization by Leveraging Relationships Between Electrical Wafer Sorting and Complete-Line Statistical Process Control Data

Dmitrii Fomin, Anastasiia Doinychko, Daniele Vinciguerra, David Lemoine, Valéria Borodin, Daniele Pagano, Gabriele Tochino, Agnès Roussy, Andres Torres, Marco Stefano Scroppo

December 7, 2025article en

Abstract

No abstract available for this paper.

Centre National de la Recherche Scientifique (FR), STMicroelectronics (Switzerland) (CH), Mines Saint-Étienne (FR), STMicroelectronics (Czechia) (CZ), IMT Atlantique (FR), Siemens (France) (FR), Siemens Healthcare (United States) (US)

Openalex Percentile: Top 25%

Advanced Statistical Process Monitoring

DOI Source OpenAlex

AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.

Towards Process Optimization by Leveraging Relationships Between Electrical Wafer Sorting and Complete-Line Statistical Process Control Data — Dmitrii Fomin, Anastasiia Doinychko, et al. · (2025) | TGRS Research Map | TGRS