High-throughput X-ray total scattering measurement system at BL04B2 of SPring-8
X-ray total scattering is widely used for analyzing pair distribution functions (PDFs) to elucidate the local structure of materials. For achieving high-throughput PDF analysis, a beamline monochromator and an experimental system were updated at BL04B2 of SPring-8. The system consists of a diffractometer and 2D area detectors, which cover a wide Q range of 0.2-27 Å<sup>-1</sup> at a photon energy of 113 keV, with a temperature control capability between 100 and 1100 K. The typical measurement time is reduced to ∼10 min per sample, which is more than ten times faster than the conventional setup. This system enables efficient structural analysis of various types of materials such as liquids, glasses and nanocrystals while yielding abundant measurement data for use in materials science.
Authors
- Shigeru Kimura (ORCID: https://orcid.org/0000-0003-1064-7572)
- H Yamazaki
- Hiroki Yamada (ORCID: https://orcid.org/0000-0003-4960-238X)
- Michitaka Takemoto
- Seiya Shimono (ORCID: https://orcid.org/0000-0003-1608-3296)
- H Ohashi
- Yuki Sada (ORCID: https://orcid.org/0000-0002-7910-646X)
- Jo-Chi Tseng
- Kenji Tamasaku (ORCID: https://orcid.org/0000-0003-1440-0518)
- K. Sugimoto
- Yuji Higo (ORCID: https://orcid.org/0000-0002-4221-8783)
- Ichiro Inoue
- Koji Ohara
- Takaki Hatsui
- Makina Yabashi
- Osami Sakata
- Shogo Kawaguchi
- Masakuni Takahashi
- Kei Watanabe
- Yasuhiko Imai
Institutions
- SPring-8 (JP)
- Japan Synchrotron Radiation Research Institute (JP)
Publication Details
- Journal
- Journal of Synchrotron Radiation
- Published
- 2026-01-05
- DOI
- https://doi.org/10.1107/s1600577525011294
- Primary Topic
- X-ray Diffraction in Crystallography
- Type
- article
- Field-Weighted Citation Impact
- 0.00