Demonstration of a family of X-ray dark-field retrieval approaches on a common set of samples

There are various imaging setups capable of capturing dark-field images, each with its own capabilities and limitations. Across all these setups, the underlying physical mechanism responsible for dark-field contrast is generally defined similarly: small-angle X-ray scattering from sub-resolution structures, multiple refraction from large resolvable features and/or edge effects. Despite this conceptual consistency, there remains a lack of studies that directly compare different dark-field imaging setups using identical samples. We have recently developed a `family' of dark-field imaging techniques that, although they have different experimental setups, each extract dark-field contrast by directly resolving dark-field-associated local image blurring with a high-resolution camera. In this paper, we provide a qualitative comparison of the capabilities of this family of methods, covering both different experimental acquisition methods and image-retrieval algorithms for this subset of dark-field imaging techniques. We acquired X-ray imaging data from two test samples using synchrotron propagation-based, single-grid and speckle-based setups, and retrieved dark-field images from each dataset using an appropriate algorithm. The dark-field retrieval methods differed in their computational framework: single-shot algorithms were applied for the single-grid and speckle-based approaches, an additional multi-exposure method was used for speckle data, and a dual-energy method was applied to the propagation-based data. We find that all approaches successfully retrieve dark-field contrast in microstructure-dense regions, as expected. Differences arise at high-spatial-frequency sample features, such as edges, and some approaches exhibit artefacts. We attribute these differences to variations in experimental parameters (e.g. pixel size, sample-to-detector distance and X-ray energy) and to the algorithmic assumptions underlying each technique (e.g. the single-material assumption and treatment of phase effects). This study aims to guide users of dark-field imaging in selecting the most suitable technique for their imaging goals. To this end, we provide a summary table and highlight opportunities for future research into the sources of dark-field contrast across emerging methods.

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Publication Details

Journal
Journal of Synchrotron Radiation
Published
2026-01-12
DOI
https://doi.org/10.1107/s1600577525011403
Primary Topic
Advanced X-ray Imaging Techniques
Type
article
Field-Weighted Citation Impact
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article

Demonstration of a family of X-ray dark-field retrieval approaches on a common set of samples

Kaye S. Morgan, Ying Ying How, Samantha J. Alloo, Michelle K. Croughan et al.
Journal of Synchrotron Radiation
Advanced X-ray Imaging Techniques
article

Demonstration of a family of X-ray dark-field retrieval approaches on a common set of samples

Kaye S. Morgan, Ying Ying How, Samantha J. Alloo, Michelle K. Croughan, Jannis N. Ahlers, David M. Paganin
article en

Abstract

There are various imaging setups capable of capturing dark-field images, each with its own capabilities and limitations. Across all these setups, the underlying physical mechanism responsible for dark-field contrast is generally defined similarly: small-angle X-ray scattering from sub-resolution structures, multiple refraction from large resolvable features and/or edge effects. Despite this conceptual consistency, there remains a lack of studies that directly compare different dark-field imaging setups using identical samples. We have recently developed a `family' of dark-field imaging techniques that, although they have different experimental setups, each extract dark-field contrast by directly resolving dark-field-associated local image blurring with a high-resolution camera. In this paper, we provide a qualitative comparison of the capabilities of this family of methods, covering both different experimental acquisition methods and image-retrieval algorithms for this subset of dark-field imaging techniques. We acquired X-ray imaging data from two test samples using synchrotron propagation-based, single-grid and speckle-based setups, and retrieved dark-field images from each dataset using an appropriate algorithm. The dark-field retrieval methods differed in their computational framework: single-shot algorithms were applied for the single-grid and speckle-based approaches, an additional multi-exposure method was used for speckle data, and a dual-energy method was applied to the propagation-based data. We find that all approaches successfully retrieve dark-field contrast in microstructure-dense regions, as expected. Differences arise at high-spatial-frequency sample features, such as edges, and some approaches exhibit artefacts. We attribute these differences to variations in experimental parameters (e.g. pixel size, sample-to-detector distance and X-ray energy) and to the algorithmic assumptions underlying each technique (e.g. the single-material assumption and treatment of phase effects). This study aims to guide users of dark-field imaging in selecting the most suitable technique for their imaging goals. To this end, we provide a summary table and highlight opportunities for future research into the sources of dark-field contrast across emerging methods.

Journal of Synchrotron RadiationVol. 33(2)
Monash University (AU)
Openalex Percentile: Top 79%
Advanced X-ray Imaging Techniques
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