Fault Injection for Simulink-based CPS Models: Insights and Future Directions

Ensuring the safety and reliability of Cyber-Physical Systems (CPS) is critical, particularly in safety-critical domains such as automotive and aerospace. Fault Injection (FI) is a well-established technique for testing system resilience, but current FI tools often face challenges when applied to Simulink-based CPS models. In this paper, we analyze the shortcomings of existing FI methods, and reflect on the key challenges of FI for Simulink-based CPS models. By offering insights into these challenges and proposing research pathways, we aim to inspire further advances in FI methodologies, enabling more robust testing of CPS in real-world applications.

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Published
2025-11-16
DOI
https://doi.org/10.1109/ase63991.2025.00326
Primary Topic
Radiation Effects in Electronics
Type
article
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article

Fault Injection for Simulink-based CPS Models: Insights and Future Directions

Domenico Bianculli, Claudio Mandrioli, Drishti Yadav
Radiation Effects in Electronics
article

Fault Injection for Simulink-based CPS Models: Insights and Future Directions

Domenico Bianculli, Claudio Mandrioli, Drishti Yadav
article en

Abstract

Ensuring the safety and reliability of Cyber-Physical Systems (CPS) is critical, particularly in safety-critical domains such as automotive and aerospace. Fault Injection (FI) is a well-established technique for testing system resilience, but current FI tools often face challenges when applied to Simulink-based CPS models. In this paper, we analyze the shortcomings of existing FI methods, and reflect on the key challenges of FI for Simulink-based CPS models. By offering insights into these challenges and proposing research pathways, we aim to inspire further advances in FI methodologies, enabling more robust testing of CPS in real-world applications.

TU Wien (AT), University of Luxembourg (LU)
Openalex Percentile: Top 38%
Radiation Effects in Electronics
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