Atomic Insights of Irradiation-Induced Thermal Conductivity Degradation in β-Ga <sub>2</sub> O <sub>3</sub>
β-Ga<sub>2</sub>O<sub>3</sub> shows great potential for extreme-environment applications. However, its low thermal conductivity inevitably limits device reliability. Herein, the defect evolution and thermal conductivity degradation caused by irradiation along different β-Ga<sub>2</sub>O<sub>3</sub> orientations are systematically investigated by simulations and experimental verifications. The simulation results suggest that Ga vacancies, O interstitials, and Ga<sub>O</sub> antisite defects are the predominant defects after primary irradiation damage. Besides, a reordering of the anisotropic thermal conductivity after primary irradiation damage is observed, sequencing from κ<sub>⊥(010)</sub> > κ<sub>⊥(001)</sub> > κ<sub>⊥(100)</sub> (before irradiation) to κ<sub>⊥(010)</sub> > κ<sub>⊥(100)</sub> > κ<sub>⊥(001)</sub> (after irradiation). The experiments verify that the thermal conductivity of (100)-oriented β-Ga<sub>2</sub>O<sub>3</sub> is significantly reduced by 34.38% after irradiation with a 2.0 MeV electron beam at a total fluence of 1.0 × 10<sup>17</sup> cm<sup>-2</sup>. This work clarifies the anisotropic degradation of thermal conductivity due to irradiation, providing atomic-level insights for optimizing the thermal transport properties in β-Ga<sub>2</sub>O<sub>3</sub>-based devices.
Authors
- Bin Zhu (ORCID: https://orcid.org/0000-0003-2829-2925)
- Taiqiao Liu (ORCID: https://orcid.org/0009-0003-3926-8354)
- Xin Yang (ORCID: https://orcid.org/0000-0001-9860-423X)
- E Zhou (ORCID: https://orcid.org/0000-0003-4965-3451)
- Zeyuan Li (ORCID: https://orcid.org/0009-0005-9043-2345)
- Zhaofu Zhang (ORCID: https://orcid.org/0000-0002-1406-1256)
- Junlei Zhao
- Jiaren Feng (ORCID: https://orcid.org/0009-0002-8811-5074)
- Xiaoyu Fei (ORCID: https://orcid.org/0009-0004-5872-5116)
- Xiaona Huang
- Yanan Yue
- Yuzheng Guo
- Sheng Liu
Institutions
- Hunan University (CN)
- Wuhan University (CN)
- Institute of Microelectronics (CN)
- Suzhou Research Institute (CN)
- Microelectronics Research Development (United States) (US)
- National Power (United Kingdom) (GB)
Publication Details
- Journal
- The Journal of Physical Chemistry Letters
- Published
- 2026-01-21
- DOI
- https://doi.org/10.1021/acs.jpclett.5c03556
- Primary Topic
- Ga2O3 and related materials
- Type
- article
- Field-Weighted Citation Impact
- 0.00