TRIXS: a multilayer grating solution towards highly efficient resonant inelastic tender X-ray scattering

Resonant inelastic X-ray scattering (RIXS) is a photon-in/photon-out spectroscopic technique which has become increasingly important for the condensed matter physics community. The development of the RIXS instrumentation in soft X-ray and hard X-ray range facilitated the research in 3d and 5d transition metal (TM)-based materials, respectively. However, the tender X-ray (2000-3000 eV) RIXS covering most of 4d TM-based materials severely falls behind due to the lack of high-performance energy dispersive optics. Here, we demonstrate the design and fabrication of a laterally graded multilayer grating (MLG) optics for the establishment of the tender RIXS at the I21 RIXS beamline in Diamond Light Source. The successful implementation of the MLG boosts the photon flux by more than an order of magnitude at the Sulfur K-edge (2475 eV) and the Ru L<sub>3</sub>-edge (2838 eV) in comparison to the solution of a single-layer coated grating (SLG). More importantly, MLG retains the high energy resolution of the SLG design (~10,000) and works continuously across the full range of 2000-3000 eV. It renders the I21 beamline as the very first RIXS facility in the world that covers both soft and tender X-rays (280-3000 eV) using a grating-based spectrometer for a wide range of science applications.

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Publication Details

Journal
Light Science & Applications
Published
2026-01-21
DOI
https://doi.org/10.1038/s41377-025-02172-7
Primary Topic
Advanced X-ray Imaging Techniques
Type
article
Field-Weighted Citation Impact
0.00

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article

TRIXS: a multilayer grating solution towards highly efficient resonant inelastic tender X-ray scattering

J. Choi, Sahil Tippireddy, S. Agrestini, K. -J. Zhou et al.
Light Science & Applications
Advanced X-ray Imaging Techniques
article

TRIXS: a multilayer grating solution towards highly efficient resonant inelastic tender X-ray scattering

J. Choi, Sahil Tippireddy, S. Agrestini, K. -J. Zhou, Yeqi Zhuang, A. C. Walters, Hongchang Wang, Shengyou Wen, Runen Qi, Igor V. Kozhevnikov, Zhong Zhang, Mirian Garcia-Fernandez, Zhanshan Wang, Zhe Zhang, Thomas Rice, Qiushi Huang
article en

Abstract

Resonant inelastic X-ray scattering (RIXS) is a photon-in/photon-out spectroscopic technique which has become increasingly important for the condensed matter physics community. The development of the RIXS instrumentation in soft X-ray and hard X-ray range facilitated the research in 3d and 5d transition metal (TM)-based materials, respectively. However, the tender X-ray (2000-3000 eV) RIXS covering most of 4d TM-based materials severely falls behind due to the lack of high-performance energy dispersive optics. Here, we demonstrate the design and fabrication of a laterally graded multilayer grating (MLG) optics for the establishment of the tender RIXS at the I21 RIXS beamline in Diamond Light Source. The successful implementation of the MLG boosts the photon flux by more than an order of magnitude at the Sulfur K-edge (2475 eV) and the Ru L<sub>3</sub>-edge (2838 eV) in comparison to the solution of a single-layer coated grating (SLG). More importantly, MLG retains the high energy resolution of the SLG design (~10,000) and works continuously across the full range of 2000-3000 eV. It renders the I21 beamline as the very first RIXS facility in the world that covers both soft and tender X-rays (280-3000 eV) using a grating-based spectrometer for a wide range of science applications.

Light Science & ApplicationsVol. 15(1)
Tongji University (CN), Shanghai Jiao Tong University (CN), Diamond Light Source (GB), Southern University of Science and Technology (CN), National Synchrotron Radiation Laboratory (CN), Zhejiang Tongji Vocational College of Science and Technology (CN)
Diamond Light Source, National Natural Science Foundation of China, Tongji University, University of Science and Technology of China, Southern University of Science and Technology, National Key Research and Development Program of China
Affordable and clean energy
Openalex Percentile: Top 81%
Advanced X-ray Imaging Techniques
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