Mobile-focused spatial inspection of industrial parts using 2D image processing and LiDAR
• Mobile-based system for the spatial inspection of industrial parts. • Optimized deep learning with D LiDAR enables effective quality assurance. • Core inspection logic successfully moved to mobile for on-device processing. • Optimized pipeline enables near-interactive mobile performance with over 10 × speedup. Fixed optical benches and desktop 3-D scanners remain costly and inflexible for inspecting small manufactured parts in the field. This study introduces a fully mobile, on-device spatial-inspection pipeline that runs on an iPhone 15 Pro, combining Core ML-optimised YOLOv11 instance segmentation of 1920 × 1440 RGB frames with real-time ARKit LiDAR depth maps and calibrated camera poses. Detected 2-D masks are un-projected to 3-D, yielding metric contours used to compute diameters, slot lengths, and thickness. Bench tests on representative sheet-metal coupons show sub-millimetre mean-absolute errors for features below 10 mm (0.06 mm for 3 mm holes; 0.14 mm for 8 mm slots) and 2–3 mm error for 55 mm holes, while the complete analysis cycle averages 0.6 s on-device, enabling near-interactive feedback. A calibration mode alerts users when the handset drifts more than 2 cm from its reference pose, limiting accumulated depth error. These results demonstrate that consumer-grade LiDAR, when coupled with hardware-aware deep-learning compression, can deliver factory-relevant dimensional accuracy at a fraction of traditional metrology costs, though further work is required to improve large-feature precision and achieve sub-100 ms frame rates.
Authors
- Олексій Водка (ORCID: https://orcid.org/0000-0002-4462-9869)
- Dmytro Bondar (ORCID: https://orcid.org/0009-0003-0548-2467)
- José Machado
- Yevheniia Basova
Institutions
- National Technical University "Kharkiv Polytechnic Institute" (UA)
- University of Minho (PT)
Publication Details
- Journal
- Measurement
- Published
- 2026-01-21
- DOI
- https://doi.org/10.1016/j.measurement.2026.120522
- Primary Topic
- Optical measurement and interference techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00