New photon BPM setup using SiC devices in photoconductive mode

Photon Beam Position Monitors (pBPM) detect photon beam intensity and position in synchrotron light sources and are capable to operate in real time during experiments, without altering beam properties and ideally discriminating between insertion device (ID) and bending magnet (BM) radiation. Early approaches used metallic blades based on photoemission from beam tails, but failed with micrometric beams or too high energy photons. They were also unable to distinguish between BM and ID radiation. Newer techniques based on CVD diamond detectors, using charge collection in four quadrants, work well at high energies but absorb too much at soft X-rays or lower energies. Thinning sensors down to the nanometer scale is technically challenging and does not solve the problem of light source discrimination. We propose an innovative method using intrinsic silicon carbide (SiC) sensors, not as a replacement for blades, but as a matrix of photoconductive elements, positioned directly after the synchrotron source, each capable of separately detecting BM and ID radiation. Initial tests show sub-micron sensitivity and clear separation of beam contributions, offering a new way forward.

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Publication Details

Journal
JACOW
Published
2026-01-20
DOI
https://doi.org/10.18429/jacow-ibic2025-wepmo17
Primary Topic
Diamond and Carbon-based Materials Research
Type
article
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article

New photon BPM setup using SiC devices in photoconductive mode

R. Sergo, M. Montagnese, D. Giuressi, Marcello Coreno et al.
JACOW
Diamond and Carbon-based Materials Research
article

New photon BPM setup using SiC devices in photoconductive mode

R. Sergo, M. Montagnese, D. Giuressi, Marcello Coreno, Vittorio Di Trapani, Monica de Simone, Gabriele Bonano, G. Cautero, G. Brajnik, Matija Colja, Jaka Pribošek, Marco Cautero, Nicola Mahne, W. Mühleisen, Evgeniia Lagosh, Michele Alagia
article en

Abstract

Photon Beam Position Monitors (pBPM) detect photon beam intensity and position in synchrotron light sources and are capable to operate in real time during experiments, without altering beam properties and ideally discriminating between insertion device (ID) and bending magnet (BM) radiation. Early approaches used metallic blades based on photoemission from beam tails, but failed with micrometric beams or too high energy photons. They were also unable to distinguish between BM and ID radiation. Newer techniques based on CVD diamond detectors, using charge collection in four quadrants, work well at high energies but absorb too much at soft X-rays or lower energies. Thinning sensors down to the nanometer scale is technically challenging and does not solve the problem of light source discrimination. We propose an innovative method using intrinsic silicon carbide (SiC) sensors, not as a replacement for blades, but as a matrix of photoconductive elements, positioned directly after the synchrotron source, each capable of separately detecting BM and ID radiation. Initial tests show sub-micron sensitivity and clear separation of beam contributions, offering a new way forward.

JACOW
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Diamond and Carbon-based Materials Research
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New photon BPM setup using SiC devices in photoconductive mode — R. Sergo, M. Montagnese, et al. · JACOW (2026) | TGRS Research Map | TGRS