High-Sensitivity Dual-Energy X-ray Detection and Imaging Using Perovskite Thin Crystals

Dual-energy X-ray imaging is of significant interest for medical diagnostics, security screening, and industrial inspection; however, existing approaches based on photon-counting or multilayer detectors often increase the system complexity. Here, we introduce a surface-treated perovskite thin-crystal device with an engineered electrode architecture, enabling high-sensitivity, dual-energy X-ray imaging. With surface treatment, the device achieves enhanced optoelectronic performance with a sensitivity of 4.5 × 10⁴ μC·Gy^1-·cm^-2, a low detection limit of 13.8 nGy·s^-1, and greatly improved device stability. By tailoring the internal electric field distribution through the electrode design, the device achieves controlled absorption of X-ray photons with different energies, thereby exhibiting an excellent energy discrimination capability. Subtraction imaging of overlapping low- and high-density objects was successfully reconstructed by the algorithmic processing of response currents. Furthermore, precise material differentiation was achieved through introducing the ratio of X-ray absorption coefficients (μ_L/μ_H), which cannot be realized by conventional X-ray detectors. Our study provides a simple and efficient route for dual-energy X-ray imaging and offers new perspectives for the development of multifunctional perovskite-based devices.