Enhancing STEM Tomography via Generative Interpolation of Tilt Series for Nanoparticle Analysis

Transmission electron microscopy offers atomic resolution, which is critical for analyzing nanomaterials. However, its two-dimensional nature limits its ability to capture full three-dimensional (3D) morphologies, which has motivated the development of 3D techniques such as electron tomography. While these techniques improve visualization, they are constrained by beam sensitivity, which can damage materials during prolonged exposure. In this study, we demonstrated the efficacy of the Frame Interpolation for Large Motion (FILM) method -augmenting STEM tilt series by synthesizing intermediate projections between measured tilt images-for enhancing the quality of the 3D reconstruction of nanoparticles using scanning transmission electron microscopy tomography. When applied to a nanooctahedron, a hollow nanotube, and a nanoframe, FILM outperformed traditional linear interpolation, yielding superior image quality assessment scores, particularly for complex structures acquired with large tilt intervals. However, when the structure is relatively simple and the angular sampling is sufficiently dense, FILM interpolation may not yield further improvement and can even oversmooth subtle surface features. This method is particularly promising for the visualization of intricate nanostructures, indicating its potential for various applications in electron tomography.

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Publication Details

Journal
Microscopy and Microanalysis
Published
2025-12-08
DOI
https://doi.org/10.1093/mam/ozaf135
Primary Topic
Advanced Electron Microscopy Techniques and Applications
Type
article
Field-Weighted Citation Impact
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Enhancing STEM Tomography via Generative Interpolation of Tilt Series for Nanoparticle Analysis

Kwangyeol Lee, Thierry Épicier, Dongwook Lee, Woonbae Sohn et al.
Microscopy and Microanalysis
Advanced Electron Microscopy Techniques and Applications
article

Enhancing STEM Tomography via Generative Interpolation of Tilt Series for Nanoparticle Analysis

Kwangyeol Lee, Thierry Épicier, Dongwook Lee, Woonbae Sohn, Heungjo An, Yongju Hong, Hionsuck Baik
article en

Abstract

Transmission electron microscopy offers atomic resolution, which is critical for analyzing nanomaterials. However, its two-dimensional nature limits its ability to capture full three-dimensional (3D) morphologies, which has motivated the development of 3D techniques such as electron tomography. While these techniques improve visualization, they are constrained by beam sensitivity, which can damage materials during prolonged exposure. In this study, we demonstrated the efficacy of the Frame Interpolation for Large Motion (FILM) method -augmenting STEM tilt series by synthesizing intermediate projections between measured tilt images-for enhancing the quality of the 3D reconstruction of nanoparticles using scanning transmission electron microscopy tomography. When applied to a nanooctahedron, a hollow nanotube, and a nanoframe, FILM outperformed traditional linear interpolation, yielding superior image quality assessment scores, particularly for complex structures acquired with large tilt intervals. However, when the structure is relatively simple and the angular sampling is sufficiently dense, FILM interpolation may not yield further improvement and can even oversmooth subtle surface features. This method is particularly promising for the visualization of intricate nanostructures, indicating its potential for various applications in electron tomography.

Microscopy and MicroanalysisVol. 32(1)
Université Claude Bernard Lyon 1 (FR), Kumoh National Institute of Technology (KR), Centre National de la Recherche Scientifique (FR), Technology Innovation Institute (AE), Institute for Basic Science (KR), Korea Basic Science Institute (KR), Institut de Recherches sur la Catalyse et l'Environnement de Lyon (FR), Institute of Natural Science (KP)
Openalex Percentile: Top 15%
Advanced Electron Microscopy Techniques and Applications
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