Terahertz rectification up to 2.5 THz by using an Asymmetric Dual-Grating Gate GFETs via ratchet effect
Asymmetric dual grating gates graphene field effect transistor (FET) was fabricated and characterized at two tones terahertz frequency 0.15 & 0.3 THz at 10K. The channel of the device was a monolayer graphene placed between two sheets of hexagonal boron nitride h-BN. Enhancement of the measured photocurrent was observed at a bias of different signs between the top and the back gates. This behavior was associated with the ratchet effect that is induced by both biasing and THz radiation. This opens the way for the development of new highly efficient detectors of terahertz radiation for different applications.
Authors
- Y.M. Meziani
- Ken Watanabe (ORCID: https://orcid.org/0000-0001-7374-7322)
- Taiichi Otsuji (ORCID: https://orcid.org/0000-0002-0887-0479)
- Vito Clericò (ORCID: https://orcid.org/0000-0001-6646-8309)
- E. Abidi
- T. Taniguchi
- J. Calvo-Gallego
- J.E. Velázquez Pérez
Institutions
- Universidad de Salamanca (ES)
- Tohoku University (JP)
- Material Sciences (United States) (US)
Publication Details
- Published
- 2025-08-17
- DOI
- https://doi.org/10.1109/irmmw-thz61557.2025.11319891
- Primary Topic
- Terahertz technology and applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00