Synthetic gain for electron-beam spectroscopy

Electron-beam microscopy and spectroscopy featuring atomic-scale spatial resolution have become essential tools used daily in almost all branches of nanoscale science and technology. As a natural supercontinuum source of light, free electrons couple with phonons, plasmons, electron-hole pairs, inter- and intra-band transitions, and inner-shell ionization. The multiple excitations, intertwined with the intricate nature of nanostructured samples, present significant challenges in isolating specific spectral characteristics amidst complex experimental backgrounds. Here we introduce the approach of synthetic complex frequency waves to mitigate these challenges in free-electron-light interaction. The complex frequency waves, created through causality-informed coherent superposition of real-frequency waves induced by free electrons, offer virtual gain to offset material losses. This amplifies and enhances spectral features, as confirmed by our electron energy loss and cathodoluminescence measurements on multilayer membranes, suspended nanoparticles, and film-coupled nanostructures. Strikingly, we reveal that our approach can retrieve resonance excitation completely buried underneath the zero-loss peak, substantially enhance the quality of hyperspectral imaging, and resolve entangled multiple-photon-electron events in their quantum interaction. Our findings indicate the versatile utility of complex frequency waves in various electron-beam spectroscopy and their promising diagnostic capabilities in free-electron quantum optics.

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Publication Details

Journal
Nature Communications
Published
2026-01-14
DOI
https://doi.org/10.1038/s41467-025-68189-z
Primary Topic
Advanced Electron Microscopy Techniques and Applications
Type
article
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article

Synthetic gain for electron-beam spectroscopy

Shu Yang, Yi-Xin Sha, Kebo Zeng, Yiqin CHEN et al.
Nature Communications
Advanced Electron Microscopy Techniques and Applications
article

Synthetic gain for electron-beam spectroscopy

Shu Yang, Yi-Xin Sha, Kebo Zeng, Yiqin CHEN, Shuang Zhang, Yang Yu, Yongliang Chen, Zetao Xie, Shimeng Gong, Huigao Duan, Zeling Chen
article en

Abstract

Electron-beam microscopy and spectroscopy featuring atomic-scale spatial resolution have become essential tools used daily in almost all branches of nanoscale science and technology. As a natural supercontinuum source of light, free electrons couple with phonons, plasmons, electron-hole pairs, inter- and intra-band transitions, and inner-shell ionization. The multiple excitations, intertwined with the intricate nature of nanostructured samples, present significant challenges in isolating specific spectral characteristics amidst complex experimental backgrounds. Here we introduce the approach of synthetic complex frequency waves to mitigate these challenges in free-electron-light interaction. The complex frequency waves, created through causality-informed coherent superposition of real-frequency waves induced by free electrons, offer virtual gain to offset material losses. This amplifies and enhances spectral features, as confirmed by our electron energy loss and cathodoluminescence measurements on multilayer membranes, suspended nanoparticles, and film-coupled nanostructures. Strikingly, we reveal that our approach can retrieve resonance excitation completely buried underneath the zero-loss peak, substantially enhance the quality of hyperspectral imaging, and resolve entangled multiple-photon-electron events in their quantum interaction. Our findings indicate the versatile utility of complex frequency waves in various electron-beam spectroscopy and their promising diagnostic capabilities in free-electron quantum optics.

Nature CommunicationsVol. 17(1)
Hunan University (CN), Hong Kong University of Science and Technology (HK), University of Hong Kong - Shenzhen Hospital (CN), Institut de Recherche et d’Innovation (FR), University of Hong Kong (HK)
Affordable and clean energy
Openalex Percentile: Top 90%
Advanced Electron Microscopy Techniques and Applications
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