Reliability test program for submillimeter-wave low-noise amplifiers
This paper presents the key findings from reliability testing campaign for sub-millimeter wave amplifiers. A total of 48 packaged amplifiers at two nominal center frequencies, 243 GHz and 330 GHz, undergoes a reliability test program consisting of step stress tests, life tests, humidity tests, as well as environmental and mechanical tests. The results will provide new information for future Earth Observation missions.
Authors
- Arnulf Leuther (ORCID: https://orcid.org/0000-0002-4369-591X)
- Jouni Latti
- Mikko Kantanen (ORCID: https://orcid.org/0009-0002-6721-7506)
- A. Tessmann (ORCID: https://orcid.org/0000-0002-0046-4417)
- Markus Rösch (ORCID: https://orcid.org/0000-0002-9600-3040)
- Jussi Varis
- Mikko Kärkkäinen
Institutions
- Fraunhofer Institute for Applied Solid State Physics (DE)
- Society of Swedish Literature in Finland (FI)
- European Space Research and Technology Centre (NL)
- VTT Technical Research Centre of Finland (FI)
Publication Details
- Published
- 2025-08-17
- DOI
- https://doi.org/10.1109/irmmw-thz61557.2025.11319659
- Primary Topic
- Superconducting and THz Device Technology
- Type
- article
- Field-Weighted Citation Impact
- 0.00