Untrained Position-Encoded Multilayer Perceptron Network for Structured Illumination Microscopy Reconstruction

Structured Illumination Microscopy (SIM) enables super-resolution imaging by encoding high-frequency spatial information through patterned light. While traditional Fourier-based reconstruction methods are prone to artifacts under suboptimal conditions, recent deep learning approaches often require large training datasets and lack adaptability across different imaging setups. In this work, we present Position Encoded Multi-Layer Perceptron (PEM) network that leverages implicit neural representations (INRs) and SIM forward-model-driven modeling to reconstruct super-resolved images without any training data. PEM-SIM represents each spatial coordinate as a combination of sinusoidal functions across multiple frequencies, enabling rich encoding of fine spatial detail. A forward model grounded in SIM image formation principles is then used to iteratively optimize reconstructions by minimizing the structural similarity loss between the generated images and the acquired SIM data. We demonstrate that PEM-SIM reconstructs both 2D and 3D SIM images with fewer input frames than conventional methods and successfully predicts missing axial planes in 3D stacks. The method shows robustness across varying signal-to-noise ratios and performs comparably to standard algorithms on both synthetic and experimental datasets. By eliminating the dependency on large datasets and enabling flexible, high-resolution reconstructions, PEM-SIM offers a data-efficient alternative for super-resolution imaging in microscopy.

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Publication Details

Journal
Chemical & Biomedical Imaging
Published
2026-01-13
DOI
https://doi.org/10.1021/cbmi.5c00153
Primary Topic
Advanced Fluorescence Microscopy Techniques
Type
article
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article

Untrained Position-Encoded Multilayer Perceptron Network for Structured Illumination Microscopy Reconstruction

Joby Joseph, Krishnendu Samanta, Balpreet Singh Ahluwalia, Dushan N. Wadduwage et al.
Chemical & Biomedical Imaging
Advanced Fluorescence Microscopy Techniques
article

Untrained Position-Encoded Multilayer Perceptron Network for Structured Illumination Microscopy Reconstruction

Joby Joseph, Krishnendu Samanta, Balpreet Singh Ahluwalia, Dushan N. Wadduwage, Sahil Sharma, Leonidas Zimianitis
article en

Abstract

Structured Illumination Microscopy (SIM) enables super-resolution imaging by encoding high-frequency spatial information through patterned light. While traditional Fourier-based reconstruction methods are prone to artifacts under suboptimal conditions, recent deep learning approaches often require large training datasets and lack adaptability across different imaging setups. In this work, we present Position Encoded Multi-Layer Perceptron (PEM) network that leverages implicit neural representations (INRs) and SIM forward-model-driven modeling to reconstruct super-resolved images without any training data. PEM-SIM represents each spatial coordinate as a combination of sinusoidal functions across multiple frequencies, enabling rich encoding of fine spatial detail. A forward model grounded in SIM image formation principles is then used to iteratively optimize reconstructions by minimizing the structural similarity loss between the generated images and the acquired SIM data. We demonstrate that PEM-SIM reconstructs both 2D and 3D SIM images with fewer input frames than conventional methods and successfully predicts missing axial planes in 3D stacks. The method shows robustness across varying signal-to-noise ratios and performs comparably to standard algorithms on both synthetic and experimental datasets. By eliminating the dependency on large datasets and enabling flexible, high-resolution reconstructions, PEM-SIM offers a data-efficient alternative for super-resolution imaging in microscopy.

Chemical & Biomedical Imaging
Pennsylvania State University (US), Harvard University Press (US), Dominion University College (GH), Centre for Arctic Gas Hydrate, Environment and Climate (NO), Applied Photonics (United Kingdom) (GB), Advanced Imaging Research (United States) (US), Indian Institute of Technology Indore (IN), Indian Institute of Technology Delhi (IN), UiT The Arctic University of Norway (NO), Old Dominion University (US)
Openalex Percentile: Top 91%
Advanced Fluorescence Microscopy Techniques
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