Direct Observation of Ultrafast Defect-Bound and Free Exciton Dynamics in Defect-Engineered WS <sub>2</sub> Monolayers
Defects in two-dimensional transition metal dichalcogenides (TMDCs) broadly affect their optical and electronic properties. Directly capturing the ultrafast processes of exciton trapping and defect-bound exciton formation is crucial for understanding and advancing defect-mediated optoelectronics and quantum technologies. However, the weak transient optical absorption of defect-bound excitons has limited their experimental observation to date. Here, we report the direct observation of the ultrafast dynamics of defect-bound excitons in monolayer WS<sub>2</sub> crystals with a high density of monosulfur vacancies (V<sub>S</sub>) and W-site defect complexes (S<sub>W</sub>V<sub>S</sub>) resulting from synthesis by alkali metal halide-assisted chemical vapor deposition. The dynamics of excitons bound to these defects, along with their coherent interactions with free excitons, are elucidated using ultrafast optical spectroscopy. Using above band-edge photoexcitation, we find that both free and defect-bound excitons simultaneously form within 300 fs from hot carrier relaxation. The defect-bound excitons exhibit shorter lifetimes than free excitons, leading to a population difference of the corresponding excitonic states and free exciton trapping within a 1-100 ps window. Band-edge photoexcitation of free and defect-bound exciton states reveals ultrafast interconversion within ∼150 fs (comparable to our temporal resolution), indicating possible coherent coupling between these states. We further demonstrate efficient up-conversion of defect-bound excitons to free excitons with photon energies up to ∼300 meV below the free exciton resonance. These findings provide insights into the ultrafast dynamics of defect-bound excitons in TMDCs and their coupling with free excitons, which are relevant to defect-engineered optoelectronic, quantum photonic, and valleytronic applications.
Authors
- Christopher M. Rouleau (ORCID: https://orcid.org/0000-0002-5488-3537)
- Kyungnam Kang (ORCID: https://orcid.org/0000-0002-0819-2495)
- Tae Gwan Park (ORCID: https://orcid.org/0000-0002-6158-0091)
- Alexander A. Puretzky (ORCID: https://orcid.org/0000-0002-9996-4429)
- David B. Geohegan (ORCID: https://orcid.org/0000-0003-0273-3139)
- Kai Xiao (ORCID: https://orcid.org/0009-0002-1033-4023)
- Liam Collins (ORCID: https://orcid.org/0000-0003-4946-9195)
- Austin Houston (ORCID: https://orcid.org/0009-0005-8777-4686)
- Gerd Duscher (ORCID: https://orcid.org/0000-0002-2039-548X)
- Xufan Li (ORCID: https://orcid.org/0000-0001-9814-0383)
Institutions
- Oak Ridge National Laboratory (US)
- Los Alamos National Laboratory (US)
- Center for Integrated Nanotechnologies (US)
- Honda (United States) (US)
- Center for Nanophase Materials Sciences
- University of Tennessee at Knoxville (US)
Publication Details
- Journal
- ACS Nano
- Published
- 2026-01-12
- DOI
- https://doi.org/10.1021/acsnano.5c18559
- Primary Topic
- 2D Materials and Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00