Recent Advances in Digital Fringe Projection Profilometry (2022–2025): Techniques, Applications, and Metrological Challenges—A Review
Digital fringe projection profilometry (DFPP) is a widely used technique for full-field, non-contact 3D surface measurement, offering precision from the sub-micrometer-to-millimeter scale depending on system geometry and fringe design. This review provides a consolidated synthesis of advances reported between 2022 and 2025, covering projection and imaging architectures, phase formation and unwrapping strategies, calibration approaches, high-speed implementations, and learning-based reconstruction methods. A central contribution of this review is the integration of these developments within a metrological perspective, explicitly relating phase–height transformation, fringe parameters, system geometry, and calibration to dominant uncertainty sources and error propagation. Recent progress highlights trade-offs between sensitivity, robustness, computational complexity, and applicability to non-ideal surfaces, while learning-based and hybrid optical–computational approaches demonstrate substantial improvements in reconstruction reliability under challenging conditions. Remaining challenges include measurements on reflective or transparent surfaces, dynamic scenes, environmental instability, and real-time operation. The review outlines emerging research directions such as physics-informed learning, digital twins, programmable optics, and autonomous calibration, providing guidance for the development of next-generation DFPP systems for precision metrology.
Authors
- Cristina Ramírez-Fernández (ORCID: https://orcid.org/0000-0002-4123-3623)
- Alan López-Martínez
- Ismael Hernández-Capuchin
- José Luis Javier Sánchez-González
- Eddie Clemente
- Mishraim Sanchez-Torres
Institutions
- Universidad Autónoma de Baja California (MX)
- Ensenada Institute of Technology (MX)
- Tecnológico Nacional de México (MX)
- Instituto Tecnológico de León (MX)
- Centro Nacional de Investigación y Desarrollo Tecnológico (MX)
Publication Details
- Journal
- Metrology
- Published
- 2026-01-12
- DOI
- https://doi.org/10.3390/metrology6010003
- Citations
- 2
- Primary Topic
- Optical measurement and interference techniques
- Type
- article
- Field-Weighted Citation Impact
- 93.68