Recent Advances in Digital Fringe Projection Profilometry (2022–2025): Techniques, Applications, and Metrological Challenges—A Review

Digital fringe projection profilometry (DFPP) is a widely used technique for full-field, non-contact 3D surface measurement, offering precision from the sub-micrometer-to-millimeter scale depending on system geometry and fringe design. This review provides a consolidated synthesis of advances reported between 2022 and 2025, covering projection and imaging architectures, phase formation and unwrapping strategies, calibration approaches, high-speed implementations, and learning-based reconstruction methods. A central contribution of this review is the integration of these developments within a metrological perspective, explicitly relating phase–height transformation, fringe parameters, system geometry, and calibration to dominant uncertainty sources and error propagation. Recent progress highlights trade-offs between sensitivity, robustness, computational complexity, and applicability to non-ideal surfaces, while learning-based and hybrid optical–computational approaches demonstrate substantial improvements in reconstruction reliability under challenging conditions. Remaining challenges include measurements on reflective or transparent surfaces, dynamic scenes, environmental instability, and real-time operation. The review outlines emerging research directions such as physics-informed learning, digital twins, programmable optics, and autonomous calibration, providing guidance for the development of next-generation DFPP systems for precision metrology.

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Publication Details

Journal
Metrology
Published
2026-01-12
DOI
https://doi.org/10.3390/metrology6010003
Citations
2
Primary Topic
Optical measurement and interference techniques
Type
article
Field-Weighted Citation Impact
93.68
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article

Recent Advances in Digital Fringe Projection Profilometry (2022–2025): Techniques, Applications, and Metrological Challenges—A Review

Cristina Ramírez-Fernández, Alan López-Martínez, Ismael Hernández-Capuchin, José Luis Javier Sánchez-González et al.
2 citations
Metrology
Optical measurement and interference techniques
93.68
article

Recent Advances in Digital Fringe Projection Profilometry (2022–2025): Techniques, Applications, and Metrological Challenges—A Review

Cristina Ramírez-Fernández, Alan López-Martínez, Ismael Hernández-Capuchin, José Luis Javier Sánchez-González, Eddie Clemente, Mishraim Sanchez-Torres
article en
2 citations

Abstract

Digital fringe projection profilometry (DFPP) is a widely used technique for full-field, non-contact 3D surface measurement, offering precision from the sub-micrometer-to-millimeter scale depending on system geometry and fringe design. This review provides a consolidated synthesis of advances reported between 2022 and 2025, covering projection and imaging architectures, phase formation and unwrapping strategies, calibration approaches, high-speed implementations, and learning-based reconstruction methods. A central contribution of this review is the integration of these developments within a metrological perspective, explicitly relating phase–height transformation, fringe parameters, system geometry, and calibration to dominant uncertainty sources and error propagation. Recent progress highlights trade-offs between sensitivity, robustness, computational complexity, and applicability to non-ideal surfaces, while learning-based and hybrid optical–computational approaches demonstrate substantial improvements in reconstruction reliability under challenging conditions. Remaining challenges include measurements on reflective or transparent surfaces, dynamic scenes, environmental instability, and real-time operation. The review outlines emerging research directions such as physics-informed learning, digital twins, programmable optics, and autonomous calibration, providing guidance for the development of next-generation DFPP systems for precision metrology.

MetrologyVol. 6(1)
Universidad Autónoma de Baja California (MX), Ensenada Institute of Technology (MX), Tecnológico Nacional de México (MX), Instituto Tecnológico de León (MX), Centro Nacional de Investigación y Desarrollo Tecnológico (MX)
Openalex Percentile: Top 0%
Optical measurement and interference techniques
93.68
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